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Iron as a source of efficient Shockley-Read-Hall recombination in GaN
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2016 (English)In: Applied Physics Letters, ISSN 0003-6951, E-ISSN 1077-3118, Vol. 109, no 16, article id 162107Article in journal (Refereed) Published
Abstract [en]

Transition metal impurities are known to adversely affect the efficiency of electronic and optoelectronic devices by introducing midgap defect levels that can act as efficient Shockley-Read-Hall centers. Iron impurities in GaN do not follow this pattern: their defect level is close to the conduction band and hence far from midgap. Using hybrid functional first-principles calculations, we uncover the electronic properties of Fe and we demonstrate that its high efficiency as a nonradiative center is due to a recombination cycle involving excited states. Unintentional incorporation of iron impurities at modest concentrations (10(15) cm(-3)) leads to nanosecond nonradiative recombination lifetimes, which can be detrimental for the efficiency of electronic and optoelectronic devices.

Place, publisher, year, edition, pages
American Institute of Physics (AIP), 2016. Vol. 109, no 16, article id 162107
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Physical Sciences
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URN: urn:nbn:se:kth:diva-198977DOI: 10.1063/1.4964831ISI: 000386933200021Scopus ID: 2-s2.0-84992436629OAI: oai:DiVA.org:kth-198977DiVA, id: diva2:1065673
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QC 20170116

Available from: 2017-01-16 Created: 2016-12-22 Last updated: 2022-06-27Bibliographically approved

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Marcinkevičius, Saulius

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