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SCORE: A Novel Scheme to Efficiently Cache Overlong ECCs in NAND Flash Memory
Huazhong Univ Sci & Technol, Sch Opt & Elect Informat, Wuhan, Hubei, Peoples R China.;Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan, Hubei, Peoples R China..
Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan, Hubei, Peoples R China..
KTH, School of Electrical Engineering and Computer Science (EECS), Electronics.ORCID iD: 0000-0003-0061-3475
Temple Univ, Dept Comp & Informat Sci, Philadelphia, PA 19122 USA..
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2019 (English)In: ACM Transactions on Architecture and Code Optimization (TACO), ISSN 1544-3566, E-ISSN 1544-3973, Vol. 15, no 4, article id 60Article in journal (Refereed) Published
Abstract [en]

Technology scaling and program/erase cycling result in an increasing bit error rate in NAND flash storage. Some solid state drives (SSDs) adopt overlong error correction codes (ECCs), whose redundancy size exceeds the spare area limit of flash pages, to protect user data for improved reliability and lifetime. However, the read performance is significantly degraded, because a logical data page and its ECC redundancy are stored in two flash pages. In this article, we find that caching ECCs has a large potential to reduce flash reads by achieving higher hit rates, compared to caching data. Then, we propose a novel scheme to efficiently cache overlong ECCs, called SCORE, to improve the SSD performance. Exceeding ECC redundancy (called ECC residues) of logically consecutive data pages are grouped into ECC pages. SCORE partitions RAM to cache both data pages and ECC pages in a workload-adaptive manner. Finally, we verify SCORE using extensive trace-driven simulations. The results show that SCORE obtains high ECC hit rates without sacrificing data hit rates, thus improving the read performance by an average of 22% under various workloads, compared to the state-of-the-art schemes.

Place, publisher, year, edition, pages
ASSOC COMPUTING MACHINERY , 2019. Vol. 15, no 4, article id 60
Keywords [en]
Solid state drive, overlong ECC, cache partitioning
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-244128DOI: 10.1145/3291052ISI: 000457136000021Scopus ID: 2-s2.0-85061187710OAI: oai:DiVA.org:kth-244128DiVA, id: diva2:1289544
Note

QC 20190218

Available from: 2019-02-18 Created: 2019-02-18 Last updated: 2019-02-18Bibliographically approved

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Lu, Zhonghai

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