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Impact of turbine availability and wake effect on the application of dynamic thermal rating of wind farm export transformers
KTH, School of Electrical Engineering and Computer Science (EECS), Electrical Engineering, Electromagnetic Engineering and Fusion Science.ORCID iD: 0000-0001-5591-7287
KTH, School of Electrical Engineering and Computer Science (EECS), Electrical Engineering, Electromagnetic Engineering and Fusion Science.ORCID iD: 0000-0002-2964-7233
Hitachi Energy Research, Västerås, Sweden.
Department of Earth Sciences, Wind Energy Section, Uppsala University, Visby, Sweden.
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2024 (English)In: Energy Reports, E-ISSN 2352-4847, Vol. 11, p. 1399-1411Article in journal (Refereed) Published
Abstract [en]

Dynamic thermal rating allows transformers to operate beyond the nameplate rating according to the actual weather and loading conditions. This paper proposes a methodology to improve the application of this technology in the design of new transformers or in the operation of existing transformers connected to wind farms by accurately predicting their load profiles, accounting for the influence of wake effect and turbine availability. Specifically, the variation of turbine availability due to the intermittent wind is considered in the load profile estimation. Additionally, a correction method, which can be incorporated into any wake model, is proposed to improve the accuracy of wake loss computation. A case study shows that the wake effect and the changing turbine availability shorten the time that the transformers maintain at full load, thereby reducing the aging rate of the wind farm export transformers. The findings suggest that considering these two factors in the DTR application can benefit the longevity and efficiency of wind farm exported transformers.

Place, publisher, year, edition, pages
Elsevier BV , 2024. Vol. 11, p. 1399-1411
Keywords [en]
Transformer aging, Transformer loading, Turbine availability, Wake effect, Wind farm reliability
National Category
Energy Engineering Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-342617DOI: 10.1016/j.egyr.2023.12.042ISI: 001166178900001Scopus ID: 2-s2.0-85182519809OAI: oai:DiVA.org:kth-342617DiVA, id: diva2:1831211
Note

QC 20240201

Available from: 2024-01-25 Created: 2024-01-25 Last updated: 2024-06-19Bibliographically approved

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Li, ZhongtianHilber, Patrik

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