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Unveiling nano-scale chemical inhomogeneity in surface oxide films formed on V- and N-containing martensite stainless steel by synchrotron X-ray photoelectron emission spectroscopy/microscopy and microscopic X-ray absorption spectroscopy
KTH, School of Engineering Sciences in Chemistry, Biotechnology and Health (CBH), Chemistry, Surface and Corrosion Science.ORCID iD: 0000-0002-6218-2108
KTH, School of Engineering Sciences in Chemistry, Biotechnology and Health (CBH), Chemistry, Surface and Corrosion Science. University of Science & Technology Beijing, Institute of Advanced Materials & Technology, Beijing 100083 China.
cUddeholms AB, Hagfors, 683 85 Sweden.
dLund University, Division of Synchrotron Radiation Research, Lund, 221 00 Sweden.
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2025 (English)In: Journal of Materials Science & Technology, ISSN 1005-0302, Vol. 205, p. 191-203Article in journal (Refereed) Published
Abstract [en]

Nano-scale chemical inhomogeneity in surface oxide films formed on a V- and N-containing martensite stainless steel and tempering heating induced changes are investigated by a combination of synchrotron- based hard X-ray Photoelectron emission spectroscopy (HAXPES) and microscopy (HAXPEEM) as well as microscopic X-ray absorption spectroscopy (μ-XAS) techniques. The results reveal the inhomogeneity in the oxide films on the micron-sized Cr2N- and VN-type particles, while the inhomogeneity on the martensite matrix phase exists due to localised formation of nano-sized tempering nitride particles at 600 °C. The oxide film formed on Cr2N-type particles is rich in Cr2O3 compared with that on the martensite matrix and VN-type particles. With the increase of tempering temperature, Cr2O3 formation is faster for the oxidation of Cr in the martensite matrix than the oxidation of Cr nitride-rich particles.

Place, publisher, year, edition, pages
Chinese Society of Metals , 2025. Vol. 205, p. 191-203
Keywords [en]
Hard X-ray photoelectron emission spectroscopy, Martensite stainless steel, Surface oxide film, Synchrotron microscopic X-ray absorption spectroscopy, Synchrotron X-ray photoelectron emission microscopy
National Category
Chemical Sciences
Identifiers
URN: urn:nbn:se:kth:diva-346795DOI: 10.1016/j.jmst.2024.04.006Scopus ID: 2-s2.0-85192725356OAI: oai:DiVA.org:kth-346795DiVA, id: diva2:1860409
Note

QC 20240528

Available from: 2024-05-24 Created: 2024-05-24 Last updated: 2024-05-28Bibliographically approved

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Yue, XiaoqiChen, DihaoPan, Jinshan

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