Purpose: Evaluation of a new sensor for micrometer-resolution photon-counting CT. Approach: DAC-sweeps are performed using a commercial x-ray tube and are compared to simulations. An edge-scan using a 250 µm tungsten wafer without any interaction logic is also performed, as well as single interaction readout of the energy spectrum that is compared to simulations. Results: The edge-scan shows a line spread function with a full width at half maximum of 11.6 µm and a 5% modulation transfer function at 850 lp/cm. Conclusions: Fair agreement with simulations indicated that employing the interaction can further significantly improve spatial resolution.