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Evaluation of a Second-Generation Ultra-Fast Energy-Resolved ASIC for Photon-Counting Spectral CT
KTH, Skolan för teknikvetenskap (SCI), Fysik, Medicinsk avbildning.
KTH, Skolan för teknikvetenskap (SCI), Fysik, Medicinsk avbildning.ORCID-id: 0000-0002-5092-8822
KTH, Skolan för teknikvetenskap (SCI), Fysik, Medicinsk avbildning.ORCID-id: 0000-0001-8560-3262
KTH, Skolan för teknikvetenskap (SCI), Fysik, Medicinsk avbildning.
Vise andre og tillknytning
2013 (engelsk)Inngår i: IEEE Transactions on Nuclear Science, ISSN 0018-9499, E-ISSN 1558-1578, Vol. 60, nr 1, s. 437-445Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

A second-generation ultra-fast energy-resolved application specific integrated circuit (ASIC) has been developed for photon-counting spectral computed tomography (CT). The energy resolution, threshold dispersion and gain of the ASIC were characterized with synchrotron radiation at Diamond Light Source. The standard deviation of threshold offsets at zero keV is 0.89 keV. An RMS energy resolution of 1.09 keV has been demonstrated for 15 keV photon energy at a count rate of 40 kcps, and it deteriorates at a rate of 0.29 keV/Mcps with the increase of output cout rate. The count rate performance of the ASIC has also been evaluated with 120 kV polychromatic x-rays produced by a tungsten anode tube and the results are presented.

sted, utgiver, år, opplag, sider
2013. Vol. 60, nr 1, s. 437-445
Emneord [en]
Photon counting, spectral computed tomography, silicon strip detector, ASIC, synchrotron
HSV kategori
Forskningsprogram
SRA - E-vetenskap (SeRC)
Identifikatorer
URN: urn:nbn:se:kth:diva-105611DOI: 10.1109/TNS.2012.2228276ISI: 000314973200032Scopus ID: 2-s2.0-84873729895OAI: oai:DiVA.org:kth-105611DiVA, id: diva2:571534
Forskningsfinansiär
Swedish e‐Science Research Center
Merknad

QC 20130319. Updated from accepted to published.

Tilgjengelig fra: 2012-11-22 Laget: 2012-11-22 Sist oppdatert: 2017-12-07bibliografisk kontrollert
Inngår i avhandling
1. A Segmented Silicon Strip Detector for Photon-Counting Spectral Computed Tomography
Åpne denne publikasjonen i ny fane eller vindu >>A Segmented Silicon Strip Detector for Photon-Counting Spectral Computed Tomography
2012 (engelsk)Doktoravhandling, med artikler (Annet vitenskapelig) [Kunstnerisk arbeiden]
Abstract [en]

Spectral computed tomography with energy-resolving detectors has a potential to improve the detectability of images and correspondingly reduce the radiation dose to patients by extracting and properly using the energy information in the broad x-ray spectrum. A silicon photon-counting detector has been developed for spectral CT and it has successfully solved the problem of high photon flux in clinical CT applications by adopting the segmented detector structure and operating the detector in edge-on geometry. The detector was evaluated by both the simulation and measurements.

The effects of energy loss and charge sharing on the energy response of this segmented silicon strip detector with different pixel sizes were investigated by Monte Carlo simulation and a comparison to pixelated CdTe detectors is presented. The validity of spherical approximations of initial charge cloud shape in silicon detectors was evaluated and a more accurate statistical model has been proposed.

A photon-counting energy-resolving application specific integrated circuit (ASIC) developed for spectral CT was characterized extensively by electrical pulses, pulsed laser and real x-ray photons from both the synchrotron and an x-ray tube. It has been demonstrated that the ASIC performs as designed. A noise level of 1.09 keV RMS has been measured and a threshold dispersion of 0.89 keV RMS has been determined. The count rate performance of the ASIC in terms of count loss and energy resolution was evaluated by real x-rays and promising results have been obtained.

The segmented silicon strip detector was evaluated using synchrotron radiation. An energy resolution of 16.1% has been determined with 22 keV photons in the lowest flux limit, which deteriorates to 21.5% at an input count rate of 100 Mcps mm−2. The fraction of charge shared events has been estimated and found to be 11.1% for 22 keV and 15.3% for 30 keV. A lower fraction of charge shared events and an improved energy resolution can be expected by applying a higher bias voltage to the detector.

sted, utgiver, år, opplag, sider
Stockholm: KTH Royal Institute of Technology, 2012. s. viii, 43
Serie
Trita-FYS, ISSN 0280-316X ; 2012:88
Emneord
photon counting, spectral computed tomography, silicon strip detector, ASIC, energy resolution, cadmium telluride, charge sharing, Monte Carlo simulation, synchrotron
HSV kategori
Identifikatorer
urn:nbn:se:kth:diva-105614 (URN)978-91-7501-589-7 (ISBN)
Disputas
2012-12-14, FA32, AlbaNova University Center, KTH, Roslagstullsbacken 21, Stockholm, 13:15 (engelsk)
Opponent
Veileder
Merknad

QC 20121123

Tilgjengelig fra: 2012-11-23 Laget: 2012-11-23 Sist oppdatert: 2012-11-23bibliografisk kontrollert

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