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X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis
KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik. Harwell Science and Innovation Campus, United Kingdom.
Vise andre og tillknytning
2017 (engelsk)Inngår i: Physical Review Letters, ISSN 0031-9007, E-ISSN 1079-7114, Vol. 118, nr 20, artikkel-id 203903Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

We present a method for x-ray phase-contrast imaging and metrology applications based on the sample-induced modulation and subsequent computational demodulation of a random or periodic reference interference pattern. The proposed unified modulated pattern analysis (UMPA) technique is a versatile approach and allows tuning of signal sensitivity, spatial resolution, and scan time. We characterize the method and demonstrate its potential for high-sensitivity, quantitative phase imaging, and metrology to overcome the limitations of existing methods.

sted, utgiver, år, opplag, sider
American Physical Society, 2017. Vol. 118, nr 20, artikkel-id 203903
HSV kategori
Identifikatorer
URN: urn:nbn:se:kth:diva-208807DOI: 10.1103/PhysRevLett.118.203903ISI: 000401663500006PubMedID: 28581800Scopus ID: 2-s2.0-85019949624OAI: oai:DiVA.org:kth-208807DiVA, id: diva2:1109515
Forskningsfinansiär
EU, FP7, Seventh Framework Programme, 279753
Merknad

QC 20170614

Tilgjengelig fra: 2017-06-14 Laget: 2017-06-14 Sist oppdatert: 2020-03-09bibliografisk kontrollert

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