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Visible and IR light waveguiding in ferroelectric Na0.5K0.5NbO3 thin films
KTH, Skolan för informations- och kommunikationsteknik (ICT), Mikroelektronik och Informationsteknik, IMIT.
KTH, Skolan för informations- och kommunikationsteknik (ICT), Materialfysik, Materialfysik, MF.ORCID-id: 0000-0001-8774-9302
KTH, Skolan för informations- och kommunikationsteknik (ICT), Mikroelektronik och Informationsteknik, IMIT.
2005 (engelsk)Inngår i: Integrated Ferroelectrics, ISSN 1058-4587, E-ISSN 1607-8489, Vol. 69, s. 277-286Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

High-quality ferroelectric thin films are attractive materials for integrated optics applications including electro-optic waveguide modulators and frequency doubling secondharmonic generators. Several fefroelectric thin film materials, such as BaTiO3, KNbO3, LiNbO3, and (Pb,La)(ZrTi)O-3, have been investigated regarding their optical and waveguiding properties. Recently the first results on waveguiding in ferroelectric Na0.5K0.5NbO3 (NKN) thin films were presented. Perovskite NKN films have previously been investigated as electrically tunable material for low loss rf and microwave applications. Na0.5K0.5NbO3 thin films of thickness 0.5-1.0 mum have been deposited on Nd:YAlO3(001) and Al2O3(0112) substrates using rf-magnetron sputtering of a stoichiometric, high-density ceramic target. X-ray diffraction measurements confirmed films grown highly (00l) oriented on the perovskite Nd:YAlO3 substrate and preferentially c-axis oriented on the single crystal r-cut sapphire substrate. Optical and waveguiding properties were characterized using a Metricon 2010 prism-coupling apparatus with a rutile prism. Dark-line spectra were obtained at visible light (lambda = 632.8 nm) as well as at infrared optical communication wavelengths, lambda = 1319 nm and lambda = 1549 nm, in both transverse electric (TE) and transverse magnetic (TM) polarizations. Sharp dips corresponding to waveguide propagation modes in the thin film layers where observed for both substrates. The calculated refractive index values and corresponding birefringence (Deltan = n(TM) - n(TE) = n(e) - n(o)) as a function of wavelength has been compared. Generally a larger birefringence is observed for the NKN film on Nd:YAlO3, which is in agreement with the larger degree of preferential c-axis orientation measured by XRD.

sted, utgiver, år, opplag, sider
2005. Vol. 69, s. 277-286
Emneord [en]
Na0.5K0.5NbO3 films, rf-magnetron sputtering, waveguiding, refractive index, birefringence, prism coupling, sapphire
HSV kategori
Identifikatorer
URN: urn:nbn:se:kth:diva-14526DOI: 10.1080/10584580590899027ISI: 000226933000031Scopus ID: 2-s2.0-33644782690OAI: oai:DiVA.org:kth-14526DiVA, id: diva2:332567
Merknad
QC 20100525 QC 20111011.Tilgjengelig fra: 2010-08-05 Laget: 2010-08-05 Sist oppdatert: 2017-12-12bibliografisk kontrollert
Inngår i avhandling
1. Electro-Optical Na0.5K0.5NbO3 Films
Åpne denne publikasjonen i ny fane eller vindu >>Electro-Optical Na0.5K0.5NbO3 Films
2005 (engelsk)Doktoravhandling, med artikler (Annet vitenskapelig)
Abstract [en]

Ferroelectric oxides are a group of advanced electronic materials with a wide variety of properties useful in applications such as memory devices, resonators and filters, infrared sensors, microelectromechanical systems, and optical waveguides and modulators.

Among the oxide perovskite-structured ferroelectric thin film materials, sodium potassium niobate or Na0.5K0.5NbO3 (NKN) has recently emerged as one of the most promising materials in radio frequency (rf) and microwave applications due to high dielectric tenability and low dielectric loss.

This thesis presents results on growth and structural, optical, and electrical characterization of NKN thin films. The films were deposited by rf-magnetron sputtering of a stoichiometric, high density, ceramic Na0.5K0.5NbO3 target onto single crystal LaAlO3 (LAO), Al2O3 (sapphire), SrTiO3, and Nd:YAlO3, and polycrystalline Pt80Ir20 substrates. By x-ray diffractometry, NKN films on c-axis oriented LaAlO3, SrTiO3 and Nd:YAlO3 substrates were found to grow epitaxially, whereas films on r-cut sapphire and polycrystalline Pt80Ir20 substrates were found to be preferentially (00l) oriented. The surface morphology was explored using atomic force microscopy.

Optical and waveguiding properties of the Na0.5K0.5NbO3/substrate heterostructures were characterized using prism-coupling technique. Sharp and distinguishable transverse magnetic and electric propagation modes were observed for NKN thicknesses up to 2.0 μm. The extraordinary and ordinary refractive indices were calculated together with the birefringence of the NKN material. The electro-optic effect in transverse geometry was measured in transmission, where the effective linear electro-optic response was determined to reff = 28 pm/V for NKN/Al2O3 with an applied dc field up to 18 kV/cm.

The ferroelectric state in NKN films on Pt80Ir20 at room temperature was indicated by a polarization loop with saturated polarization as high as 33.4 μC/cm2 at 700 kV/cm, remnant polarization of 10 μC/cm2, and coercive field of 90 kV/cm. Current-voltage characteristics of vertical Au/NKN/PtIr capacitive cells and planar Au/NKN/LAO interdigital capacitors (IDCs) showed very good insulating properties, with the leakage current density for an NKN IDC on the order of 30 nA/cm2 at 400 kV/cm. Rf dielectric spectroscopy demonstrated low loss, low frequency dispersion, and high voltage tunability. At 1 MHz, NKN/LAO showed a dissipation factor tan δ = 0.010 and a tunability of 16.5 % at 200 kV/cm. For the same structure the frequency dispersion was Δεr = 8.5 % between 1 kHz and 1 MHz.

sted, utgiver, år, opplag, sider
Stockholm: KTH, 2005. s. xii, 91
Serie
Trita-FYS, ISSN 0280-316X ; 5299
Emneord
Functional materials, ferroelectrics, sodium potassium niobates, thin films, rf-magnetron sputtering, waveguiding, refractive index, prism-coupling, electro-optic effects, dielectric tunability, Funktionella material
HSV kategori
Identifikatorer
urn:nbn:se:kth:diva-193 (URN)91-7178-007-6 (ISBN)
Disputas
2005-05-20, D1, KTH, Lindstedtsvägen 17, 2tr, Stockholm, 10:00
Opponent
Veileder
Merknad
QC 20100928Tilgjengelig fra: 2005-05-12 Laget: 2005-05-12 Sist oppdatert: 2010-09-28bibliografisk kontrollert

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