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Linewidth Enhancement Factor of Semiconductor Lasers: Results from Round-Robin Measurements in COST 288
Vise andre og tillknytning
2007 (engelsk)Inngår i: 2007 CONFERENCE ON LASERS & ELECTRO-OPTICS/QUANTUM ELECTRONICS AND LASER SCIENCE CONFERENCE (CLEO/QELS 2007), VOLS 1-5, 2007Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

Round-robin measurements on the linewidth enhancement factor are carried out within several laboratories participating to EU COST 288 action. The alpha-factor is measured by applying up to 7 different techniques. The obtained results are compared.

sted, utgiver, år, opplag, sider
2007.
Emneord [en]
COST 288;linewidth enhancement factor;round-robin measurements;semiconductor lasers;semiconductor lasers;
HSV kategori
Identifikatorer
URN: urn:nbn:se:kth:diva-88022DOI: 10.1109/CLEO.2007.4452795ISI: 000268751001028Scopus ID: 2-s2.0-84898939506OAI: oai:DiVA.org:kth-88022DiVA, id: diva2:502522
Konferanse
Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference. Baltimore, MD. MAY 06-11, 2007
Merknad
QC 20120301Tilgjengelig fra: 2012-02-14 Laget: 2012-02-14 Sist oppdatert: 2012-03-01bibliografisk kontrollert

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Schatz, Richard

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