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Matched Backprojection Operator for Combined Scanning Transmission Electron Microscopy Tilt- and Focal Series
German Research Center for Artificial Intelligence GmbH (DFKI), 66123 Saarbrücken, Germany.
KTH, Skolan för teknikvetenskap (SCI), Matematik (Inst.).ORCID-id: 0000-0003-0727-9561
NM Leibniz Institute for New Materials, 66123 Saarbrücken, Germany.
German Research Center for Artificial Intelligence GmbH (DFKI), 66123 Saarbrücken, Germany.
2015 (engelsk)Inngår i: Microscopy and Microanalysis, ISSN 1431-9276, E-ISSN 1435-8115, Vol. 21, nr 3, s. 725-738Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

Combined tilt- and focal series scanning transmission electron microscopy is a recently developed method to obtain nanoscale three-dimensional (3D) information of thin specimens. In this study, we formulate the forward projection in this acquisition scheme as a linear operator and prove that it is a generalization of the Ray transform for parallel illumination. We analytically derive the corresponding backprojection operator as the adjoint of the forward projection. We further demonstrate that the matched backprojection operator drastically improves the convergence rate of iterative 3D reconstruction compared to the case where a backprojection based on heuristic weighting is used. In addition, we show that the 3D reconstruction is of better quality.

sted, utgiver, år, opplag, sider
Cambridge University Press, 2015. Vol. 21, nr 3, s. 725-738
Emneord [en]
STEM, tomography, 3D, focal series, iterative reconstruction, backprojection, depth of field
HSV kategori
Forskningsprogram
Teknisk materialvetenskap; Matematik
Identifikatorer
URN: urn:nbn:se:kth:diva-167055DOI: 10.1017/S1431927615000525ISI: 000358836400020Scopus ID: 2-s2.0-84936891955OAI: oai:DiVA.org:kth-167055DiVA, id: diva2:813013
Merknad

QC 20150615

Tilgjengelig fra: 2015-05-21 Laget: 2015-05-21 Sist oppdatert: 2017-12-04bibliografisk kontrollert

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