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Study of thin surfactant films under shear using the tribological surface force apparatus
KTH, Tidigare Institutioner                               , Kemi.ORCID-id: 0000-0002-8935-8070
2001 (Engelska)Ingår i: Tribology International, ISSN 0301-679X, E-ISSN 1879-2464, Vol. 34, nr 12, s. 815-822Artikel i tidskrift (Refereegranskat) Published
Abstract [en]

Static and dynamic behaviour of thin surfactant films in aqueous solution of hexadecyltrimethylammonium salicylate (C16TASal) were investigated using the tribological surface force apparatus. Normal force measurements show that 0.15 mM C16TASal builds up an innermost film of approximately 8-11 Angstrom thickness at each mica surface, indicating that the surfactant adsorbs in a flat conformation. Furthermore, the height of the force barrier at approximately 60 Angstrom is low (ca 2 mN/m) indicating that the second adsorbed layer is easily pushed out. Addition of salicylate salt to 0.15 mM C16TASal give rise to a more close packed structure, with a total thickness of 62-65 Angstrom. indicative of a micellar or bilayer arrangement at the surfaces. Furthermore, the frequency dependence of the shear modulus was investigated both at close separation at the innermost force barrier and at larger separations (up to 300-400 Angstrom). The visco-elastic measurements show that the elasticity modulus, G ', dominates over the loss modulus, G , for all studied cases, indicative of a more solid-like than liquid-like film. Finally, it is shown that shear at high contact pressures induces new aggregate structures at the surface.

Ort, förlag, år, upplaga, sidor
2001. Vol. 34, nr 12, s. 815-822
Nyckelord [en]
nanorheology, SFA, nanostructured films, lamellar phase, hexadecyltrimethylammonium salicylate, viscoelastic solutions, light-scattering, solid-surfaces, liquid-films, model, interfaces, vesicles, rheology
Identifikatorer
URN: urn:nbn:se:kth:diva-21146ISI: 000172508000005OAI: oai:DiVA.org:kth-21146DiVA, id: diva2:339843
Anmärkning
QC 20100525Tillgänglig från: 2010-08-10 Skapad: 2010-08-10 Senast uppdaterad: 2017-12-12Bibliografiskt granskad

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Rutland, Mark W
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