Ändra sökning
RefereraExporteraLänk till posten
Permanent länk

Direktlänk
Referera
Referensformat
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annat format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annat språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf
Fast AFM scanning with parameter space based robust repetitive control designed using the comes toolbox
KTH, Skolan för elektro- och systemteknik (EES), Reglerteknik.ORCID-id: 0000-0003-4733-2240
2010 (Engelska)Ingår i: ASME 2010 10th Biennial Conference on Engineering Systems Design and Analysis, ESDA2010: Volume 5, ASME Press, 2010, s. 599-606Konferensbidrag, Publicerat paper (Refereegranskat)
Abstract [en]

Atomic Force Microscope (AFM) is a very strong and beneficial instrument for acquiring images at nanometer scale. Hence, obtaining better image quality and scan speed is a research area of great interest. Improving the dynamic responses of the scanning probe and the vertical motion of the scanner mechanisms are the two major areas of concentration in this sense. Improving the vertical dynamics is achieved either by designing more complex scanner mechanisms with higher bandwidth or designing more sophisticated controllers rather than the PI, PID or PIID types of controllers that are mostly used in practice. In this paper, the authors focus on designing a repetitive control scheme for fast and accurate scanning. It is possible to implement repetitive control to achieve this goal when it is considered that the successive lines of the scan are quite similar due to the very small steps taken to advance on the sample. Repetitive control can reject higher frequency disturbances due to the surface topography in AFM much better than a conventional controller can, as it can drive the error caused by any periodic input signal to zero. Besides increasing the scan speed, it is also important that the phase lag can be compensated perfectly using repetitive control, with the knowledge of the surface topography from the previous period by introducing appropriate phase advance.

Ort, förlag, år, upplaga, sidor
ASME Press, 2010. s. 599-606
Nyckelord [en]
AFM, Atomic force microscopes, Conventional controllers, Higher frequencies, Input signal, Nano-meter scale, Parameter spaces, Phase advance, Phase lags, Repetitive control, Research areas, Robust repetitive control, Scanning probes, Vertical dynamics, Vertical motions, Atomic force microscopy, Dynamic response, Dynamics, Image quality, Scanning, Surface topography, Systems analysis, Controllers
Nationell ämneskategori
Reglerteknik
Identifikatorer
URN: urn:nbn:se:kth:diva-150303DOI: 10.1115/ESDA2010-24499ISI: 000291371600070Scopus ID: 2-s2.0-79956092057ISBN: 978-079184919-4 (tryckt)OAI: oai:DiVA.org:kth-150303DiVA, id: diva2:742695
Konferens
ASME 2010 10th Biennial Conference on Engineering Systems Design and Analysis, ESDA2010, 12 July 2010 through 14 July 2010, Istanbul, Turkey
Anmärkning

QC 20140902

Tillgänglig från: 2014-09-02 Skapad: 2014-09-01 Senast uppdaterad: 2015-06-10Bibliografiskt granskad

Open Access i DiVA

Fulltext saknas i DiVA

Övriga länkar

Förlagets fulltextScopus

Personposter BETA

Demirel, Burak

Sök vidare i DiVA

Av författaren/redaktören
Demirel, Burak
Av organisationen
Reglerteknik
Reglerteknik

Sök vidare utanför DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetricpoäng

doi
isbn
urn-nbn
Totalt: 26 träffar
RefereraExporteraLänk till posten
Permanent länk

Direktlänk
Referera
Referensformat
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annat format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annat språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf