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Planar Hall Effect Bridge sensor with NiFeX (X = Cu, Ag and Au) sensing layer.
KTH, School of Information and Communication Technology (ICT), Materials- and Nano Physics.ORCID iD: 0000-0003-0642-8203
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2015 (English)Conference paper, Published paper (Other academic)
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2015. article id 7156561
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-199028DOI: 10.1109/INTMAG.2015.7156561ISI: 000381606000071Scopus ID: 2-s2.0-84942474795ISBN: 978-1-4799-7321-7 (print)OAI: oai:DiVA.org:kth-199028DiVA, id: diva2:1065000
Conference
IEEE International Magnetics Conference (Intermag), MAY 11-15, 2015, Beijing, PEOPLES R CHINA
Note

QC 20170113

Available from: 2017-01-13 Created: 2016-12-22 Last updated: 2024-03-18Bibliographically approved

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Qejvanaj, FatjonMazraati, HamidJiang, ShengRedjai Sani, SohrabChung, SunjaeÅkerman, Johan

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Qejvanaj, FatjonMazraati, HamidJiang, ShengRedjai Sani, SohrabChung, SunjaeÅkerman, Johan
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Materials- and Nano Physics
Electrical Engineering, Electronic Engineering, Information Engineering

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CiteExportLink to record
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