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Planar Hall Effect Bridge sensor with NiFeX (X = Cu, Ag and Au) sensing layer.
Qejvanaj, Fatjon
Mazraati, Hamid
ORCID iD:
0000-0003-3605-8872
Jiang, Sheng
KTH, School of Information and Communication Technology (ICT), Materials- and Nano Physics.
ORCID iD:
0000-0003-0642-8203
Persson, A.
Redjai Sani, Sohrab
KTH, School of Information and Communication Technology (ICT), Materials- and Nano Physics.
ORCID iD:
0000-0002-3726-9738
Chung, Sunjae
KTH, School of Information and Communication Technology (ICT), Materials- and Nano Physics.
ORCID iD:
0000-0002-9970-0060
Magnusson, F.
Åkerman, Johan
KTH, School of Information and Communication Technology (ICT), Materials- and Nano Physics. NanOsc AB, Sweden.
ORCID iD:
0000-0002-3513-6608
Show others and affiliations
2015 (English)
Conference paper, Published paper (Other academic)
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2015. article id 7156561
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN:
urn:nbn:se:kth:diva-199028
DOI:
10.1109/INTMAG.2015.7156561
ISI:
000381606000071
Scopus ID:
2-s2.0-84942474795
ISBN:
978-1-4799-7321-7 (print)
OAI: oai:DiVA.org:kth-199028
DiVA, id:
diva2:1065000
Conference
IEEE International Magnetics Conference (Intermag), MAY 11-15, 2015, Beijing, PEOPLES R CHINA
Note
QC 20170113
Available from:
2017-01-13
Created:
2016-12-22
Last updated:
2024-03-18
Bibliographically approved
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Qejvanaj, Fatjon
Mazraati, Hamid
Jiang, Sheng
Redjai Sani, Sohrab
Chung, Sunjae
Åkerman, Johan
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Qejvanaj, Fatjon
Mazraati, Hamid
Jiang, Sheng
Redjai Sani, Sohrab
Chung, Sunjae
Åkerman, Johan
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Materials- and Nano Physics
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Electrical Engineering, Electronic Engineering, Information Engineering
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https://urn.kb.se/resolve?urn=urn:nbn:se:kth:diva-199028
Direct link
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Cite
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apa
ieee
modern-language-association-8th-edition
vancouver
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apa
ieee
modern-language-association-8th-edition
vancouver
Other style
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Language
de-DE
en-GB
en-US
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