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Advanced image analysis verifies geometry performance of micro-milling systems
KTH, Skolan för industriell teknik och management (ITM), Industriell produktion. (Industrial Metrology and Optics)
KTH, Skolan för industriell teknik och management (ITM), Industriell produktion. (Industrial Metrology and Optics)
KTH, Skolan för industriell teknik och management (ITM), Industriell produktion. (Industrial Metrology and Optics)
2017 (engelsk)Inngår i: Applied Optics, ISSN 1559-128X, E-ISSN 2155-3165, Vol. 56, nr 10, s. 2912-2921Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

Accurate dimensional measurement of micro-milled items is a challenge and machine specifications do not include operational parameters in the workshop. Therefore, a verification test that shows the machine's overall geometrical performance over its working area would help machine users in the assessment and adjustment of their equipment. In this study, we present an optical technique capable of finding micro-milled features at submicron uncertainty over working areas > 10 cm(2). The technique relies on an ultra-precision measurement microscope combined with advanced image analysis to get the center of gravity of milled cross-shaped features at subpixel levels. Special algorithms had to be developed to handle the disturbing influence of burr and milling marks. The results show repeatability, reproducibility, and axis straightness for three micro-milling facilities and also discovered an unknown 2 mu m amplitude undulation in one of them.

sted, utgiver, år, opplag, sider
OPTICAL SOC AMER , 2017. Vol. 56, nr 10, s. 2912-2921
HSV kategori
Identifikatorer
URN: urn:nbn:se:kth:diva-206258DOI: 10.1364/AO.56.002912ISI: 000398174500047PubMedID: 28375261Scopus ID: 2-s2.0-85016553883OAI: oai:DiVA.org:kth-206258DiVA, id: diva2:1095278
Merknad

QC 20170512

Tilgjengelig fra: 2017-05-12 Laget: 2017-05-12 Sist oppdatert: 2017-06-30bibliografisk kontrollert
Inngår i avhandling
1. Enhanced image analysis, a tool for precision metrology in the micro and macro world
Åpne denne publikasjonen i ny fane eller vindu >>Enhanced image analysis, a tool for precision metrology in the micro and macro world
2017 (engelsk)Doktoravhandling, med artikler (Annet vitenskapelig)
Abstract [en]

The need for high speed and cost efficient inspection in manufacturing lineshas led to a vast usage of camera-based vision systems. The performance ofthese systems is sufficient to determine shape and size, but hardly to an accuracylevel comparable with traditional metrology tools. To achieve highprecision shape/position/defect measurements, the camera techniques haveto be combined with high performance image metrology techniques whichare developed and adapted to the manufactured components. The focus ofthis thesis is the application of enhanced image analysis as a tool for highprecision metrology. Dedicated algorithms have been developed, tested andevaluated in three practical cases ranging from micro manufacturing at submicronprecision to meter sized aerospace components with precision requirementsin the 10 μm range.The latter measurement challenge was solved by low cost standard consumerproducts, i.e. digital cameras in a stereo configuration and structured lightfrom a gobo-projector. Combined with high-precision image analysis and anew approach in camera calibration and 3D reconstruction for precise 3Dshape measurement of meter sized surfaces, the achievement was fulfilledand verified by two conventional measurement systems; a high precisioncoordinate measurement machine and a laser scanner.The sub-micron challenge was the implementation of image metrology forverification of micro manufacturing installations within a joint Europeaninfrastructure network, EUMINAfab. The results were an unpleasant surprisefor some of the participating laboratories, but became a big step forwardto improve the dimensional accuracy of the investigated laser micromachining, micro milling and micro-printing systems, since the accuracy ofthese techniques are very difficult to assess.The third high precision metrology challenge was the measurement of longrange,low-amplitude topographic structures on specular (shiny) aerodynamicsurfaces. In this case Fringe Reflection Technique (FRT) was appliedand image analysis algorithms were used to evaluate the fringe deformationas a measure of the surface slopes to obtain high resolution data. The resultwas compared with an interferometric analysis showing height deviation inthe range of tens of micrometers over a lateral extension of several cm.

sted, utgiver, år, opplag, sider
KTH Royal Institute of Technology, 2017. s. 120
Serie
TRITA-IIP, ISSN 1650-1888 ; TRITA IIP-17-05
Emneord
Image processing, image metrology, precision metrology, image correlation, subpixel, accuracy, uncertainty
HSV kategori
Forskningsprogram
Industriell produktion
Identifikatorer
urn:nbn:se:kth:diva-207594 (URN)978-91-7729-392-7 (ISBN)
Disputas
2017-06-15, M311, Brinellvägen 68, Stockholm, 10:00 (engelsk)
Opponent
Veileder
Prosjekter
LOCOMACHSEUMINAfabCleansky
Merknad

QC 20170523

Tilgjengelig fra: 2017-05-23 Laget: 2017-05-22 Sist oppdatert: 2017-05-23bibliografisk kontrollert

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