Ändra sökning
RefereraExporteraLänk till posten
Permanent länk

Direktlänk
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annat format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annat språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf
Online software-based self-testing in the dark silicon era
Visa övriga samt affilieringar
2017 (Engelska)Ingår i: The Dark Side of Silicon: Energy Efficient Computing in the Dark Silicon Era, Springer, 2017, s. 259-287Kapitel i bok, del av antologi (Refereegranskat)
Abstract [en]

Aggressive technology scaling and intensive computations have caused acceleration in the aging and wear-out process of digital systems, hence leading to an increased occurrence of premature permanent faults. Online testing techniques are becoming a necessity in current and near future digital systems. However, state-of-the-art techniques are not aware of the other digital systems’ power/performance requirements that exist in modern multi-/many-core systems. This chapter presents an approach for power-aware non-intrusive online testing in many-core systems. The approach aims at scheduling at runtime Software-Based Self-Test (SBST) routines on the various cores to exploit their idle periods in order to benefit the potentially available power budget and minimize the performance degradation. Furthermore, a criticality metric is used to identify and rank cores that need testing at a time and power and reliability issues related to the testing at different voltage and frequency levels are taken into account. Experimental results show that the proposed approach can (1) efficiently perform cores’ testing, within less than 1?% penalty on system throughput and by dedicating only 2?% of the actual consumed power, (2) adapt to the current stress level of the cores by using the utilization metric, and (3) cover all the voltage and frequency levels during the various tests.

Ort, förlag, år, upplaga, sidor
Springer, 2017. s. 259-287
Nationell ämneskategori
Annan elektroteknik och elektronik
Identifikatorer
URN: urn:nbn:se:kth:diva-214655DOI: 10.1007/978-3-319-31596-6_10Scopus ID: 2-s2.0-85028855846ISBN: 9783319315966 (tryckt)ISBN: 9783319315942 (tryckt)OAI: oai:DiVA.org:kth-214655DiVA, id: diva2:1142381
Anmärkning

QC 20170919

Tillgänglig från: 2017-09-19 Skapad: 2017-09-19 Senast uppdaterad: 2017-09-19Bibliografiskt granskad

Open Access i DiVA

Fulltext saknas i DiVA

Övriga länkar

Förlagets fulltextScopus

Sök vidare i DiVA

Av författaren/redaktören
Tenhunen, Hannu
Av organisationen
Integrerade komponenter och kretsar
Annan elektroteknik och elektronik

Sök vidare utanför DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetricpoäng

doi
isbn
urn-nbn
Totalt: 350 träffar
RefereraExporteraLänk till posten
Permanent länk

Direktlänk
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annat format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annat språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf