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Research on milling temperature measuring tool embedded with NiCr/NiSi thin film thermocouple
KTH, School of Industrial Engineering and Management (ITM), Production Engineering.ORCID iD: 0000-0001-8679-8049
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2018 (English)In: 51st CIRP Conference on Manufacturing Systems, Elsevier, 2018, Vol. 72, p. 1457-1462Conference paper, Published paper (Refereed)
Abstract [en]

In order to measure the milling area temperature in-situ, the milling tool embedded with NiCr/NiSi thin film thermocouple (TFTC) is prepared. TFTC capable well temperature performance is embedded on the tool tip by successively depositing SiO2 insulating film, NiCr/NiSi thermoelectric film, and SiO2 protective film. Surface morphology and thin film properties are confirmed to achieve expectation by means of TEM and SEM. Imitation reflects that TFTC abrasion has minor effect on dynamic and static characteristic. The in-situ milling area temperature is successfully detected by TFTC temperature measuring tool in field test.

Place, publisher, year, edition, pages
Elsevier, 2018. Vol. 72, p. 1457-1462
Series
Procedia CIRP, ISSN 2212-8271 ; 72
Keywords [en]
in-situ temperature measurement, milling area temperature, milling cutting tool, thin film thermocouple
National Category
Materials Chemistry
Identifiers
URN: urn:nbn:se:kth:diva-238361DOI: 10.1016/j.procir.2018.03.109Scopus ID: 2-s2.0-85049564684OAI: oai:DiVA.org:kth-238361DiVA, id: diva2:1262510
Conference
51st CIRP Conference on Manufacturing Systems, CIRP CMS 2018, Stockholm Waterfront Congress Centre, Stockholm, Sweden, 16 May 2018 through 18 May 2018
Note

QC 20181112

Available from: 2018-11-12 Created: 2018-11-12 Last updated: 2018-11-12Bibliographically approved

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Wang, LihuiWang, Xi Vincent

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