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Fully adaptive routing algorithms and region-based approaches for two-dimensional and three-dimensional networks-on-chip
2013 (English)In: IET Computers & Digital Techniques, ISSN 1751-8601, E-ISSN 1751-861X, ISSN 1751-8601, no 6, p. 264-273Article in journal (Refereed) Published
Abstract [en]

Network congestion has negative impact on the performance of networks-on-chip (NoC). In traditional congestionawaretechniques, congestion is measured at a router level and delivered to other routers, either local or non-local. One of thecontributions of this study is to show that performance can be improved if the congestion level is measured for a group ofrouters, called cluster, and propagated over the network, rather than considering the congestion level of a single router. Thepresented approach is discussed in both two-dimensional (2D) and three-dimensional (3D) mesh networks. To collect andpropagate the congestion information of different clusters, a distributed approach is presented. The gathered information isutilised at routing units to deliver packets through the less congested regions. To distribute packets over the network withoutforming deadlock, routing algorithms should be carefully designed. The authors take advantage of fully adaptive routingalgorithms, providing the maximum degree of adaptiveness for distributing packets. For 2D NoCs, a conventional fullyadaptive routing algorithm, named dynamic XY (DyXY), is utilised. However, for 3D NoCs a fully adaptive routingalgorithm is proposed and this method is called 3D-FAR. On top of each fully adaptive routing algorithm, a region-basedapproach is developed.

Place, publisher, year, edition, pages
2013. no 6, p. 264-273
Keywords [en]
network routing;network-on-chip;switching networks;fully adaptive routing algorithms;region-based approach;three-dimensional network-on-chip;two-dimensional network-on-chip;network congestion;cluster;3D mesh networks;2D mesh networks;distributed approach;routing units;2D NoC;dynamic XY;DyXY;wormhole switching network;3D NoC;3D-FAR method;congestion level measurement
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering Embedded Systems
Identifiers
URN: urn:nbn:se:kth:diva-254867DOI: 10.1049/iet-cdt.2013.0034OAI: oai:DiVA.org:kth-254867DiVA, id: diva2:1335735
Note

QC 20190819

Available from: 2019-07-07 Created: 2019-07-07 Last updated: 2019-08-19Bibliographically approved

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Ebrahimi, Masoumeh

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