X-Ray Induced Secondary Particle Counting With Thin NbTiN Nanowire Superconducting DetectorShow others and affiliations
2021 (English)In: IEEE transactions on applied superconductivity (Print), ISSN 1051-8223, E-ISSN 1558-2515, Vol. 31, no 4, article id 2200305Article in journal (Refereed) Published
Abstract [en]
We characterized the performance of abiased superconducting nanowire to detect X-ray photons. The device, made of a 10 nm thin NbTiN film and fabricated on a dielectric substrate (SiO2, Nb3O5) detected 1000 times larger signal than anticipated from direct X-ray absorption. We attributed this effect to X-ray induced generation of secondary particles in the substrate. The enhancement corresponds to an increase in the flux by the factor of 3.6, relative to a state-of-the-art commercial X-ray silicon drift detector. The detector exhibited 8.25 ns temporal recovery time and 82 ps timing resolution, measured using optical photons. Our results emphasize the importance of the substrate in superconducting X-ray single photon detectors.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE) , 2021. Vol. 31, no 4, article id 2200305
Keywords [en]
Nanowire single photon detector, niobium titanium nitride, superconducting thin film, X-ray detection
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:kth:diva-295834DOI: 10.1109/TASC.2021.3066578ISI: 000649704900003Scopus ID: 2-s2.0-85103192843OAI: oai:DiVA.org:kth-295834DiVA, id: diva2:1558142
Note
QC 20210528
2021-05-282021-05-282022-06-25Bibliographically approved