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Effect of Scanning Strategy on Thermal Stresses and Strains during Electron Beam Melting of Inconel 625: Experiment and Simulation
KTH, School of Industrial Engineering and Management (ITM), Production engineering, Manufacturing and Metrology Systems.ORCID iD: 0000-0002-2582-9910
Northwestern Polytech Univ, Xian Inst Flexible Elect IFE, Xian Inst Biomed Mat & Engn, Frontiers Sci Ctr Flexible Elect, Xian 710072, Peoples R China..ORCID iD: 0000-0003-4577-4619
KTH, School of Engineering Sciences (SCI), Engineering Mechanics, Vehicle Engineering and Solid Mechanics, Solid Mechanics.ORCID iD: 0000-0001-6375-6292
KTH, School of Industrial Engineering and Management (ITM), Production engineering, Manufacturing and Metrology Systems.ORCID iD: 0000-0003-4120-4790
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2023 (English)In: Materials, E-ISSN 1996-1944, Vol. 16, no 1, article id 443Article in journal (Refereed) Published
Abstract [en]

This paper develops a hybrid experimental/simulation method for the first time to assess the thermal stresses generated during electron beam melting (EBM) at high temperatures. The bending and rupture of trusses supporting Inconel 625 alloy panels at similar to 1050 degrees C are experimentally measured for various scanning strategies. The generated thermal stresses and strains are thereafter simulated using the Finite-Element Method (FEM). It is shown that the thermal stresses on the trusses may reach the material UTS without causing failure. Failure is only reached after the part experiences a certain magnitude of plastic strain (similar to 0.33 +/- 0.01 here). As the most influential factor, the plastic strain increases with the scanning length. In addition, it is shown that continuous scanning is necessary since the interrupted chessboard strategy induces cracking at the overlapping regions. Therefore, the associated thermal deformation is to be minimized using a proper layer rotation according to the part length. Although this is similar to the literature reported for selective laser melting (SLM), the effect of scanning pattern is found to differ, as no significant difference in thermal stresses/strains is observed between bidirectional and unidirectional patterns from EBM.

Place, publisher, year, edition, pages
MDPI AG , 2023. Vol. 16, no 1, article id 443
Keywords [en]
thermal distortion, scanning strategy, electron beam melting (EBM), additive manufacturing simulation
National Category
Manufacturing, Surface and Joining Technology
Identifiers
URN: urn:nbn:se:kth:diva-323428DOI: 10.3390/ma16010443ISI: 000908817600001PubMedID: 36614787Scopus ID: 2-s2.0-85145774044OAI: oai:DiVA.org:kth-323428DiVA, id: diva2:1733057
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QC 20230201

Available from: 2023-02-01 Created: 2023-02-01 Last updated: 2024-07-04Bibliographically approved

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Zhao, XiaoyuWei, YuanMansour, RamiDadbakhsh, SasanRashid, Amir

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