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Thermal calibration of photodiode sensitivity for atomic force microscopy
KTH, Skolan för kemivetenskap (CHE), Kemi, Ytkemi (stängd 20081231). Ytkemiska Institutet, Sweden.ORCID-id: 0000-0002-5444-7276
KTH, Skolan för kemivetenskap (CHE), Kemi, Ytkemi (stängd 20081231). Ytkemiska Institutet, Sweden.ORCID-id: 0000-0002-8935-8070
2006 (engelsk)Inngår i: Review of Scientific Instruments, ISSN 0034-6748, E-ISSN 1089-7623, Vol. 77, nr 11Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

The photodiode sensitivity in the atomic force microscope is calibrated by relating the voltage noise to the thermal fluctuations of the cantilever angle. The method accounts for the ratio of the thermal fluctuations measured in the fundamental vibration mode to the total, and also for the tilt and extended tip of the cantilever. The method is noncontact and is suitable for soft or deformable surfaces where the constant compliance method cannot be used. For hard surfaces, the method can also be used to calibrate the cantilever spring constant.

sted, utgiver, år, opplag, sider
2006. Vol. 77, nr 11
Emneord [en]
in-situ calibration, spring constant, cantilevers, friction
HSV kategori
Identifikatorer
URN: urn:nbn:se:kth:diva-16159DOI: 10.1063/1.2387891ISI: 000242408600048OAI: oai:DiVA.org:kth-16159DiVA, id: diva2:334201
Merknad

QC 20100525. QC 20160226

Tilgjengelig fra: 2010-08-05 Laget: 2010-08-05 Sist oppdatert: 2017-12-12bibliografisk kontrollert

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