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Nuclear reaction analysis with ion microbeam of cross sections of surface layers deposited in a tokamak divertor
KTH, Skolan för elektro- och systemteknik (EES), Fusionsplasmafysik.
KTH, Skolan för informations- och kommunikationsteknik (ICT), Mikroelektronik och tillämpad fysik, MAP.
Vise andre og tillknytning
2007 (engelsk)Inngår i: Journal of Nuclear Materials, ISSN 0022-3115, E-ISSN 1873-4820, Vol. 362, nr 03-feb, s. 215-221Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

Ion micro beam analysis has been applied to the investigation of plasma deposited layers covering the divertor tiles in the JET tokamak. Since the layers are about 100 mu m thick they are too thick to be completely investigated by ordinary ion beam analysis. Cross sections of the layers were prepared by cutting and polishing. Elemental depth profiles were determined from the two dimensional images that could be derived by nuclear reaction analysis and resonant backscattering spectrometry, using ion beams focused to a few mu m spot size. A combination of analysis methods are shown, which allow measurements of the concentration profiles of carbon, beryllium, deuterium, oxygen and stainless steel components at levels of a few percent, with an accuracy better than 10%.

sted, utgiver, år, opplag, sider
2007. Vol. 362, nr 03-feb, s. 215-221
Emneord [en]
jet limiters, retention, deuterium
HSV kategori
Identifikatorer
URN: urn:nbn:se:kth:diva-16672DOI: 10.1016/j.jnucmat.2007.01.046ISI: 000246895400013Scopus ID: 2-s2.0-34247563472OAI: oai:DiVA.org:kth-16672DiVA, id: diva2:334715
Merknad
Conference: Symposium on Nuclear Materials and Materials for Fusion held at the E-MRS 2006 Spring Meeting. Nice, FRANCE. MAY 29-JUN 02, 2006 Tilgjengelig fra: 2010-08-05 Laget: 2010-08-05 Sist oppdatert: 2017-12-12bibliografisk kontrollert

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