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Optical properties of SiGe alloys
KTH, Tidigare Institutioner                               , Materialvetenskap.
Vise andre og tillknytning
2003 (engelsk)Inngår i: Journal of Applied Physics, ISSN 0021-8979, E-ISSN 1089-7550, Vol. 93, nr 7, s. 3832-3836Artikkel i tidsskrift (Fagfellevurdert) Published
Abstract [en]

The optical properties of Si1-xGex have been investigated theoretically using a full-potential linear muffin-tin-orbital method. We present the density-of-states as well as the real and imaginary parts of the dielectric function. The calculated dielectric function was found to be in good agreement with the spectroscopic ellipsometry measurements by J. Bahng , J. Phys.: Condens. Matter 13, 777 (2001), and we obtained a static dielectric constant of epsilon(0)=12.19+2.45x in the Si rich regime (xless than or equal to0.5).

sted, utgiver, år, opplag, sider
2003. Vol. 93, nr 7, s. 3832-3836
Emneord [en]
bicmos technology, enhancement-mode, brillouin-zone, special points, silicon, band, transistors, systems
Identifikatorer
URN: urn:nbn:se:kth:diva-22350DOI: 10.1063/1.1555702ISI: 000181729600016OAI: oai:DiVA.org:kth-22350DiVA, id: diva2:341048
Merknad
QC 20100525Tilgjengelig fra: 2010-08-10 Laget: 2010-08-10 Sist oppdatert: 2017-12-12bibliografisk kontrollert

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