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Electron-Impact Water-Jet Microfocus Source for Water-Window Microscopy
KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.ORCID-id: 0000-0001-7637-1850
KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.ORCID-id: 0000-0002-4394-0591
KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
Vise andre og tillknytning
2011 (engelsk)Inngår i: 10th International Conference on X-Ray Microscopy / [ed] McNulty, I; Eyberger, C; Lai, B, 2011, Vol. 1365, s. 152-155Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

We demonstrate high-brightness operation of an electron-impact water-jet-anode soft x-ray source with an increased power loading of 15 times compared to our previously published results, with a corresponding increase in similar to 525-eV x-ray intensity of 6.4 times. This has been accomplished by improving the vacuum pumping system and the electron focusing optics, and increasing the liquid-jet velocity. The source now operates up to 120-W e-beam power and at a 525-eV brightness of 3.5x10(9) ph/(sx mu m(2)xsrxline). The source concept has potential to increase the x-ray brightness by another order of magnitude by optimizing the e-beam focusing and upgrading the power supply. Currently, spot enlargement with increased power is determined to be the most important limiting factor.

sted, utgiver, år, opplag, sider
2011. Vol. 1365, s. 152-155
Serie
AIP Conference Proceedings, ISSN 0094-243X ; 1365
Emneord [en]
X-ray beamlines; light absorption; electron beams; X-ray spectra
HSV kategori
Identifikatorer
URN: urn:nbn:se:kth:diva-73360DOI: 10.1063/1.3625327ISI: 000298672400034Scopus ID: 2-s2.0-80053340271OAI: oai:DiVA.org:kth-73360DiVA, id: diva2:488817
Konferanse
10th International Conference on X-ray Microscopy. Univ Chicago, Chicago, IL. AUG 15-20, 2010
Merknad
QC 20120203. Updated from manuscript.Tilgjengelig fra: 2012-02-02 Laget: 2012-02-02 Sist oppdatert: 2014-01-14bibliografisk kontrollert
Inngår i avhandling
1. Electron-Impact Liquid-Jet Water-Window X-ray Sources
Åpne denne publikasjonen i ny fane eller vindu >>Electron-Impact Liquid-Jet Water-Window X-ray Sources
2010 (engelsk)Licentiatavhandling, med artikler (Annet vitenskapelig)
Abstract [en]

This Thesis describes the development and characterization of a soft x-ray liquidjet-anode electron-impact source. With a water-jet target the primary emission is the O Kα line at 525 eV. This is close to the lower edge of the water-window, a spectral region lacking simple laboratory sources. In the hard x-ray regime electronimpact microfocus sources have matured and are simple, stable, reliable, and inexpensive. It would be beneficial if this source concept could be used also for soft x-ray generation.  

Spectral measurements of a 120 W, 30 keV electron beam focused on a 20 μm water jet show an x-ray intensity of up to 3.2 × 1012 ph/(s×sr×line). Combined with source size measurements up to 50 W a maximum brightness of 3.5 × 109 ph/(s×μm2×sr×line) is reported. This makes the brightness comparable to the compact discharge-plasma sources presently used for soft x-ray microscopy. The source appears to be scalable another order of magnitude which would make the brightness equal to that of the laser-plasma sources.

 

sted, utgiver, år, opplag, sider
Stockholm: Universitetsservice US AB, 2010. s. xiii, 37
Serie
Trita-FYS, ISSN 0280-316X ; 2010:68
HSV kategori
Identifikatorer
urn:nbn:se:kth:diva-28622 (URN)978-91-7415-825-0 (ISBN)
Presentation
2010-12-10, Sal FB42, KTH, Roslagstullsbacken 21, AlbaNova, Stockholm, 10:00
Opponent
Veileder
Merknad
QC 20110119Tilgjengelig fra: 2011-01-19 Laget: 2011-01-18 Sist oppdatert: 2012-04-02bibliografisk kontrollert

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