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2012 (English)In: Optics Express, ISSN 1094-4087, E-ISSN 1094-4087, Vol. 20, no 4, p. 4603-4618Article in journal (Refereed) Published
Abstract [en]
Large-scale and cost-effective manufacturing of ceramic micro devices based on tape stacking requires the development of inspection systems to perform high-resolution in-process quality control of embedded manufactured cavities, metal structures and defects. With an optical coherence tomography (OCT) system operating at 1.3 mu m and a dedicated automated line segmentation algorithm, layer thicknesses can be measured and laser-machined channels can be verified in alumina ceramics embedded at around 100 mu m depth. Monte Carlo simulations are employed to analyze the abilities of OCT in imaging of the embedded channels. The light scattering parameters required as input data for simulations are evaluated from the integrating sphere measurements of collimated and diffuse transmittance spectra using a reconstruction algorithm based on refined diffusion approximation approach.
Place, publisher, year, edition, pages
Optical Society of America, 2012
Keywords
Optical coherence tomography, Nondestructive testing, Imaging through turbid media, Scattering, Image processing, Numerical approximation and analysis
National Category
Engineering and Technology
Research subject
SRA - Production
Identifiers
urn:nbn:se:kth:diva-85514 (URN)10.1364/OE.20.004603 (DOI)000301041900124 ()2-s2.0-84857331392 (Scopus ID)
Projects
Multilayer project (FP7-NMP4-2007-214122)
Funder
EU, FP7, Seventh Framework Programme, FP7-NMP4-2007-214122XPRES - Initiative for excellence in production research
Note
QC 20120221
2012-02-212012-02-132017-12-07Bibliographically approved