Endre søk
RefereraExporteraLink to record
Permanent link

Direct link
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annet format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annet språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf
Full characterization of a focused wavefield with sub 100 nm resolution
Vise andre og tillknytning
2013 (engelsk)Inngår i: Advances In X-Ray Free-Electron Lasers II: Instrumentation, SPIE - International Society for Optical Engineering, 2013, s. 87780G-Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

A hard x-ray free-electron laser (XFEL) provides an x-ray source with an extraordinary high peak-brilliance, a time structure with extremely short pulses and with a large degree of coherence, opening the door to new scientific fields. Many XFEL experiments require the x-ray beam to be focused to nanometer dimensions or, at least, benefit from such a focused beam. A detailed knowledge about the illuminating beam helps to interpret the measurements or is even inevitable to make full use of the focused beam. In this paper we report on focusing an XFEL beam to a transverse size of 125nm and how we applied ptychographic imaging to measure the complex wavefield in the focal plane in terms of phase and amplitude. Propagating the wavefield back and forth we are able to reconstruct the full caustic of the beam, revealing aberrations of the nano-focusing optic. By this method we not only obtain the averaged illumination but also the wavefield of individual XFEL pulses.

sted, utgiver, år, opplag, sider
SPIE - International Society for Optical Engineering, 2013. s. 87780G-
Serie
Proceedings of SPIE - The International Society for Optical Engineering, ISSN 0277-786X ; 8778
Emneord [en]
Compound refractive lenses, Free-electron lasers, Imaging and sensing, Ptychography, Xrays
HSV kategori
Identifikatorer
URN: urn:nbn:se:kth:diva-134056DOI: 10.1117/12.2020856ISI: 000323547400006Scopus ID: 2-s2.0-84880705432ISBN: 978-081949580-8 (tryckt)OAI: oai:DiVA.org:kth-134056DiVA, id: diva2:664938
Konferanse
Advances in X-Ray Free-Electron Lasers II: Instrumentation; Prague; Czech Republic; 17 April 2013 through 18 April 2013
Merknad

QC 20131118

Tilgjengelig fra: 2013-11-18 Laget: 2013-11-15 Sist oppdatert: 2013-11-18bibliografisk kontrollert

Open Access i DiVA

Fulltekst mangler i DiVA

Andre lenker

Forlagets fulltekstScopus

Personposter BETA

Vogt, UlrichHertz, Hans M.

Søk i DiVA

Av forfatter/redaktør
Nilsson, DanielUhlén, FredrikVogt, UlrichHertz, Hans M.
Av organisasjonen

Søk utenfor DiVA

GoogleGoogle Scholar

doi
isbn
urn-nbn

Altmetric

doi
isbn
urn-nbn
Totalt: 62 treff
RefereraExporteraLink to record
Permanent link

Direct link
Referera
Referensformat
  • apa
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Annet format
Fler format
Språk
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Annet språk
Fler språk
Utmatningsformat
  • html
  • text
  • asciidoc
  • rtf