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Diffractive optics for laboratory sources to free electron lasers
KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.ORCID-id: 0000-0002-4394-0591
KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
KTH, Skolan för teknikvetenskap (SCI), Tillämpad fysik, Biomedicinsk fysik och röntgenfysik.
Vise andre og tillknytning
2013 (engelsk)Inngår i: 11th International Conference On X-Ray Microscopy (XRM2012), Institute of Physics (IOP), 2013, Vol. 463, nr 1, s. 012001-Konferansepaper, Publicerat paper (Fagfellevurdert)
Abstract [en]

In this contribution we present our recent results in the field of diffractive optics for both soft and hard x-ray radiation, and for laboratory sources to x-ray free electron lasers (XFEL). We developed a laboratory soft x-ray microscope that uses in-house produced zone plate optics as high-resolution objectives. We continuously try to improve these optics, both in terms of efficiency and resolution. Our latest development is the manufacturing of tungsten soft x-ray zone plates with outermost zone widths of 12 nm and 90 nm high structures. For hard x-rays, we investigated the possibility to use metal zone plates on a diamond substrate for nano-focusing of the European X-ray Free Electron Laser. The simulations show that the heat conduction is efficient enough to keep a zone plate well below melting temperature. However, metal zone plates will experience large and rapid temperature fluctuations of several hundred Kelvin that might prove fatal. To test this, we manufactured tungsten on diamond prototype zone plates and exposed them to radiation from the LCLS XFEL. Results show that metal zone plates can survive the XFEL beam.

sted, utgiver, år, opplag, sider
Institute of Physics (IOP), 2013. Vol. 463, nr 1, s. 012001-
Serie
Journal of Physics Conference Series, ISSN 1742-6588 ; 463
Emneord [en]
Zone Plates, Fabrication
HSV kategori
Identifikatorer
URN: urn:nbn:se:kth:diva-137223DOI: 10.1088/1742-6596/463/1/012001ISI: 000327949000001Scopus ID: 2-s2.0-84891306833OAI: oai:DiVA.org:kth-137223DiVA, id: diva2:678425
Konferanse
11th International Conference on X-Ray Microscopy, XRM 2012; Shanghai; China; 5 August 2012 through 10 August 2012
Merknad

QC 20140113

Tilgjengelig fra: 2013-12-12 Laget: 2013-12-12 Sist oppdatert: 2020-01-30bibliografisk kontrollert

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Vogt, UlrichHertz, Hans M.Holmberg, Anders

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Vogt, UlrichReinspach, JuliaUhlén, FredrikNilsson, DanielHertz, Hans M.Holmberg, Anders
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