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Shift sprinting: Fine-grained temperature-aware NoC-based MCSoC architecture in dark silicon age
KTH, School of Information and Communication Technology (ICT), Electronics and Embedded Systems.
2016 (English)In: Proceedings - Design Automation Conference, Institute of Electrical and Electronics Engineers (IEEE), 2016, Vol. 05-09-June-2016,, a155Conference paper (Refereed)
Abstract [en]

Reliability is a critical feature of chip integration and unreliability can lead to performance, cost, and time-to-market penalties. Moreover, upcoming Many-Core System-on-Chips (MCSoCs), notably future generations of mobile devices, will suffer from high power densities due to the dark silicon problem. Thus, in this paper, a novel NoC-based MCSoC architecture, called Shift Sprinting, is introduced in order to reliably utilize dark silicon under the power budget constraint. By employing the concept of distributional sprinting, our proposed architecture provides Quality of Service (QoS) to efficiently run real-time streaming applications in mobile devices. Simulation results show meaningful gain in performance and reliability of the system compared to state-of-the-art works.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2016. Vol. 05-09-June-2016,, a155
Series
Proceedings - Design Automation Conference, ISSN 0738-100X
Keyword [en]
Dark silicon, MCSoC, NoC, Reliability, Sprinting, Temperature
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-194532DOI: 10.1145/2897937.2898090ISI: 000390302500155ScopusID: 2-s2.0-84977070347OAI: oai:DiVA.org:kth-194532DiVA: diva2:1043812
Conference
53rd Annual ACM IEEE Design Automation Conference, DAC 2016 Austin Convention CenterAustin United States 5 June 2016 through 9 June 2016
Note

QC 20161101

Available from: 2016-11-01 Created: 2016-10-31 Last updated: 2017-01-16Bibliographically approved

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Daneshtalab, Masoud
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