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Multi-view modeling and automated analysis of product line variability in systems engineering
KTH, School of Industrial Engineering and Management (ITM), Machine Design (Dept.), Mechatronics.
KTH, School of Industrial Engineering and Management (ITM), Machine Design (Dept.), Mechatronics.
2016 (English)In: Proceedings of the 20th International Systems and Software Product Line Conference / [ed] Hong Mei, Rick Rabiser, Bing Xie, Christoph Elsner, Yun Xie, Jesper Andersson, Antonio Ruiz, Cortés Krzysztof Czarnecki, Bran Selic, Andrzej Wąsowski, Xin Peng, Jocelyn Simmonds, Jun Wei, Thorsten Berger, Norbert Siegmund, Li Zhang, Ebrahim Bagheri, Yingfei Xiong, ACM Digital Library, 2016, p. 287-296Conference paper, Published paper (Refereed)
Abstract [en]

Product Lines (PL) in the systems engineering (SE) domain are one of the largest and most complex ones. The sheer number of di↵erent products that can be derived from PL points out to the scale of the challenge that Product Line Engineering (PLE) faces. Various development artifacts describe PL but due to their diversity, variability modeling across PL is a challenging task. Moreover, this complexity is a major obstacle for achieving traceability across PL which is especially important for product verification. In order to support systems engineering by establishing traceability across PL and aid verification planning we propose Multi-View Variability Model (MVVM). MVVM introduces a set of variability models that represent variability in various development artifacts, e.g. architecture, requirements etc. and corresponding inter-model constraints. We provide a formalization of MVVM and perform a transformation of the MVVM model to a Constraint Satisfiability Problem (CSP) where we formulate queries for the CSP model in order to extract information about variability dependencies among MVVM views. Throughout the paper we use a real system from the automotive domain as the working example in order to illustrate the introduced concepts

Place, publisher, year, edition, pages
ACM Digital Library, 2016. p. 287-296
Keywords [en]
Variability Modeling, Multi-View Modeling, Feature Diagram, Constraint Satisfaction Problem, Product Line, Veri- fication
National Category
Computer Systems
Identifiers
URN: urn:nbn:se:kth:diva-202307DOI: 10.1145/2934466.2946044Scopus ID: 2-s2.0-84991735050ISBN: 978-1-4503-4050-2 (print)OAI: oai:DiVA.org:kth-202307DiVA, id: diva2:1075708
Conference
20th International Systems and Software Product Line Conference, Beijing, China — September 16 - 23, 2016
Funder
VINNOVA, F6256
Note

QC 20170221

Available from: 2017-02-20 Created: 2017-02-20 Last updated: 2017-03-07Bibliographically approved

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