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Enabling Area Efficient RF ICs through Monolithic 3D Integration
KTH, School of Information and Communication Technology (ICT), Elektronics, Integrated devices and circuits.ORCID iD: u1v29l8d
KTH, School of Information and Communication Technology (ICT), Elektronics, Integrated devices and circuits.
KTH, School of Information and Communication Technology (ICT), Elektronics, Integrated devices and circuits.
KTH.
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2017 (English)In: Design Automation and Test in Europe (DATE), March 27-31, 2017, Lausanne, Switzerland, 2017Conference paper (Refereed)
Abstract [en]

The Monolithic 3D (M3D) integration technologyhas emerged as a promising alternative to dimensional scalingthanks to the unprecedented integration density capabilitiesand the low interconnect parasitics that it offers. In orderto support technological investigations and enable future M3Dcircuits, M3D design methodologies, flows and tools are essential.Prospective M3D digital applications have attracted a lot ofscientific interest. This paper identifies the potential of M3DRF/analog circuits and presents the first attempt to demonstratesuch circuits. Towards this, a M3D custom design platform, whichis fully compatible with commercial design tools, is proposed andvalidated. The design platform includes process characteristics,device models, LVS and DRC rules and a parasitic extractionflow. The envisioned M3D structure is built on a commercialCMOS process that serves as the bottom tier, whereas a SOIprocess is used as top tier. To validate the proposed design flowand to investigate the potential of M3D RF/analog circuits, aRF front-end design for Zig-Bee WPAN applications is used ascase-study. The M3D RF front-end circuit achieves 35.5 % areareduction, while showing similar performance with the original2D circuit.

Place, publisher, year, edition, pages
2017.
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Research subject
Information and Communication Technology
Identifiers
URN: urn:nbn:se:kth:diva-203348OAI: oai:DiVA.org:kth-203348DiVA: diva2:1082052
Conference
Design Automation and Test in Europe (DATE)
Funder
Swedish Foundation for Strategic Research , 76197
Note

QCR 20170321

Available from: 2017-03-15 Created: 2017-03-15 Last updated: 2017-03-21Bibliographically approved

Open Access in DiVA

The full text will be freely available from 2017-06-15 15:18
Available from 2017-06-15 15:18

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
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More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
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  • Other locale
More languages
Output format
  • html
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  • asciidoc
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