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Perfect X-ray focusing via fitting corrective glasses to aberrated optics
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2017 (English)In: Nature Communications, ISSN 2041-1723, E-ISSN 2041-1723, Vol. 8Article in journal (Refereed) Published
Abstract [en]

Due to their short wavelength, X-rays can in principle be focused down to a few nanometres and below. At the same time, it is this short wavelength that puts stringent requirements on X-ray optics and their metrology. Both are limited by today’s technology. In this work, we present accurate at wavelength measurements of residual aberrations of a refractive X-ray lens using ptychography to manufacture a corrective phase plate. Together with the fitted phase plate the optics shows diffraction-limited performance, generating a nearly Gaussian beam profile with a Strehl ratio above 0.8. This scheme can be applied to any other focusing optics, thus solving the X-ray optical problem at synchrotron radiation sources and X-ray free-electron lasers.

Place, publisher, year, edition, pages
Nature Publishing Group, 2017. Vol. 8
Keyword [en]
Imaging and sensing, Microscopy, X-rays
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Identifiers
URN: urn:nbn:se:kth:diva-203619DOI: 10.1038/ncomms14623ISI: 000395053700001Scopus ID: 2-s2.0-85014451131OAI: oai:DiVA.org:kth-203619DiVA: diva2:1082215
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QC 20170316

Available from: 2017-03-16 Created: 2017-03-16 Last updated: 2017-03-27Bibliographically approved

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Publisher's full textScopushttp://www.nature.com/articles/ncomms14623

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Rahomäki, JussiParfeniukas, KarolisGiakoumidis, StylianosVogt, Ulrich
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