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Can Dark Silicon Be Exploited to Prolong System Lifetime?
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2017 (English)In: IEEE design & test, ISSN 2168-2356, E-ISSN 2168-2364, Vol. 34, no 2, 51-59 p.Article in journal (Refereed) Published
Place, publisher, year, edition, pages
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC , 2017. Vol. 34, no 2, 51-59 p.
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Electrical Engineering, Electronic Engineering, Information Engineering
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URN: urn:nbn:se:kth:diva-206270DOI: 10.1109/MDAT.2016.2630317ISI: 000396240300007ScopusID: 2-s2.0-85014721125OAI: oai:DiVA.org:kth-206270DiVA: diva2:1095218
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QC 20170512

Available from: 2017-05-12 Created: 2017-05-12 Last updated: 2017-05-12Bibliographically approved

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