Change search
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf
Advanced image analysis verifies geometry performance of micro-milling systems
KTH, School of Industrial Engineering and Management (ITM), Production Engineering. (Industrial Metrology and Optics)
KTH, School of Industrial Engineering and Management (ITM), Production Engineering. (Industrial Metrology and Optics)
KTH, School of Industrial Engineering and Management (ITM), Production Engineering. (Industrial Metrology and Optics)
2017 (English)In: Applied Optics, ISSN 1559-128X, E-ISSN 2155-3165, Vol. 56, no 10, 2912-2921 p.Article in journal (Refereed) Published
Abstract [en]

Accurate dimensional measurement of micro-milled items is a challenge and machine specifications do not include operational parameters in the workshop. Therefore, a verification test that shows the machine's overall geometrical performance over its working area would help machine users in the assessment and adjustment of their equipment. In this study, we present an optical technique capable of finding micro-milled features at submicron uncertainty over working areas > 10 cm(2). The technique relies on an ultra-precision measurement microscope combined with advanced image analysis to get the center of gravity of milled cross-shaped features at subpixel levels. Special algorithms had to be developed to handle the disturbing influence of burr and milling marks. The results show repeatability, reproducibility, and axis straightness for three micro-milling facilities and also discovered an unknown 2 mu m amplitude undulation in one of them.

Place, publisher, year, edition, pages
OPTICAL SOC AMER , 2017. Vol. 56, no 10, 2912-2921 p.
National Category
Atom and Molecular Physics and Optics
Identifiers
URN: urn:nbn:se:kth:diva-206258DOI: 10.1364/AO.56.002912ISI: 000398174500047PubMedID: 28375261Scopus ID: 2-s2.0-85016553883OAI: oai:DiVA.org:kth-206258DiVA: diva2:1095278
Note

QC 20170512

Available from: 2017-05-12 Created: 2017-05-12 Last updated: 2017-06-30Bibliographically approved
In thesis
1. Enhanced image analysis, a tool for precision metrology in the micro and macro world
Open this publication in new window or tab >>Enhanced image analysis, a tool for precision metrology in the micro and macro world
2017 (English)Doctoral thesis, comprehensive summary (Other academic)
Abstract [en]

The need for high speed and cost efficient inspection in manufacturing lineshas led to a vast usage of camera-based vision systems. The performance ofthese systems is sufficient to determine shape and size, but hardly to an accuracylevel comparable with traditional metrology tools. To achieve highprecision shape/position/defect measurements, the camera techniques haveto be combined with high performance image metrology techniques whichare developed and adapted to the manufactured components. The focus ofthis thesis is the application of enhanced image analysis as a tool for highprecision metrology. Dedicated algorithms have been developed, tested andevaluated in three practical cases ranging from micro manufacturing at submicronprecision to meter sized aerospace components with precision requirementsin the 10 μm range.The latter measurement challenge was solved by low cost standard consumerproducts, i.e. digital cameras in a stereo configuration and structured lightfrom a gobo-projector. Combined with high-precision image analysis and anew approach in camera calibration and 3D reconstruction for precise 3Dshape measurement of meter sized surfaces, the achievement was fulfilledand verified by two conventional measurement systems; a high precisioncoordinate measurement machine and a laser scanner.The sub-micron challenge was the implementation of image metrology forverification of micro manufacturing installations within a joint Europeaninfrastructure network, EUMINAfab. The results were an unpleasant surprisefor some of the participating laboratories, but became a big step forwardto improve the dimensional accuracy of the investigated laser micromachining, micro milling and micro-printing systems, since the accuracy ofthese techniques are very difficult to assess.The third high precision metrology challenge was the measurement of longrange,low-amplitude topographic structures on specular (shiny) aerodynamicsurfaces. In this case Fringe Reflection Technique (FRT) was appliedand image analysis algorithms were used to evaluate the fringe deformationas a measure of the surface slopes to obtain high resolution data. The resultwas compared with an interferometric analysis showing height deviation inthe range of tens of micrometers over a lateral extension of several cm.

Place, publisher, year, edition, pages
KTH Royal Institute of Technology, 2017. 120 p.
Series
TRITA-IIP, ISSN 1650-1888 ; TRITA IIP-17-05
Keyword
Image processing, image metrology, precision metrology, image correlation, subpixel, accuracy, uncertainty
National Category
Engineering and Technology
Research subject
Production Engineering
Identifiers
urn:nbn:se:kth:diva-207594 (URN)978-91-7729-392-7 (ISBN)
Public defence
2017-06-15, M311, Brinellvägen 68, Stockholm, 10:00 (English)
Opponent
Supervisors
Projects
LOCOMACHSEUMINAfabCleansky
Note

QC 20170523

Available from: 2017-05-23 Created: 2017-05-22 Last updated: 2017-05-23Bibliographically approved

Open Access in DiVA

No full text

Other links

Publisher's full textPubMedScopus

Search in DiVA

By author/editor
Daemi, BitaEkberg, PeterMattsson, Lars
By organisation
Production Engineering
In the same journal
Applied Optics
Atom and Molecular Physics and Optics

Search outside of DiVA

GoogleGoogle Scholar

Altmetric score

Total: 4 hits
CiteExportLink to record
Permanent link

Direct link
Cite
Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
More styles
Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
More languages
Output format
  • html
  • text
  • asciidoc
  • rtf