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X-ray Phase-Contrast Imaging and Metrology through Unified Modulated Pattern Analysis
KTH, School of Engineering Sciences (SCI), Applied Physics. Harwell Science and Innovation Campus, United Kingdom.
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2017 (English)In: Physical Review Letters, ISSN 0031-9007, E-ISSN 1079-7114, Vol. 118, no 20, 203903Article in journal (Refereed) Published
Abstract [en]

We present a method for x-ray phase-contrast imaging and metrology applications based on the sample-induced modulation and subsequent computational demodulation of a random or periodic reference interference pattern. The proposed unified modulated pattern analysis (UMPA) technique is a versatile approach and allows tuning of signal sensitivity, spatial resolution, and scan time. We characterize the method and demonstrate its potential for high-sensitivity, quantitative phase imaging, and metrology to overcome the limitations of existing methods.

Place, publisher, year, edition, pages
American Physical Society, 2017. Vol. 118, no 20, 203903
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:kth:diva-208807DOI: 10.1103/PhysRevLett.118.203903ISI: 000401663500006Scopus ID: 2-s2.0-85019949624OAI: oai:DiVA.org:kth-208807DiVA: diva2:1109515
Funder
EU, FP7, Seventh Framework Programme, 279753
Note

QC 20170614

Available from: 2017-06-14 Created: 2017-06-14 Last updated: 2017-06-14Bibliographically approved

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