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Moiré method for nanometer instability investigation of scanning hard x-ray microscopes
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics, Biomedical and X-ray Physics.
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2017 (English)In: Optics Express, ISSN 1094-4087, E-ISSN 1094-4087, Vol. 25, no 11, 12188-12194 p.Article in journal (Refereed) Published
Abstract [en]

We present a Moiré method that can be used to investigate positional instabilities in a scanning hard x-ray microscope with nanometer precision. The development of diffractionlimited storage rings offering highly-brilliant synchrotron radiation and improvements of nanofocusing x-ray optics paves the way towards 3D nanotomography with 10 nm resolution or below. However, this trend demands improved designs of x-ray microscope instruments which should offer few-nm beam stabilities with respect to the sample. Our technique can measure the position of optics and sample stage relative to each other in the two directions perpendicular to the beam propagation in a scanning x-ray microscope using simple optical components and visible light. The usefulness of the method was proven by measuring short and long term instabilities of a zone-plate-optics-based prototype microscope. We think it can become an important tool for the characterization of scanning x-ray microscopes, especially prior to experiments with an actual x-ray beam.

Place, publisher, year, edition, pages
Optical Society of America, 2017. Vol. 25, no 11, 12188-12194 p.
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URN: urn:nbn:se:kth:diva-209609DOI: 10.1364/OE.25.012188ISI: 000403940700013Scopus ID: 2-s2.0-85019983867OAI: oai:DiVA.org:kth-209609DiVA: diva2:1113186
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QC 20170621

Available from: 2017-06-21 Created: 2017-06-21 Last updated: 2017-07-11Bibliographically approved

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Vogt, UlrichKöhler, DanielDickmann, JannisRahomäki, JussiParfeniukas, Karolis
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