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Background-Force Compensation in Dynamic Atomic Force Microscopy
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0001-8199-5510
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0002-4331-6940
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0003-0675-974X
KTH, School of Chemical Science and Engineering (CHE), Chemistry, Surface and Corrosion Science.
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2017 (English)In: Phronimon, ISSN 1561-4018, E-ISSN 2331-7019, Vol. 7, no 6, 064018Article in journal (Refereed) Published
Abstract [en]

Background forces are linear long-range interactions of the cantilever body with its surroundings that must be compensated for in order to reveal tip-surface force, the quantity of interest for determining material properties in atomic force microscopy. We provide a mathematical derivation of a method to compensate for background forces, apply it to experimental data, and discuss how to include background forces in simulation. Our method, based on linear-response theory in the frequency domain, provides a general way of measuring and compensating for any background force and it can be readily applied to different force reconstruction methods in dynamic AFM.

Place, publisher, year, edition, pages
AMER PHYSICAL SOC , 2017. Vol. 7, no 6, 064018
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Physical Sciences
Identifiers
URN: urn:nbn:se:kth:diva-210353DOI: 10.1103/PhysRevApplied.7.064018ISI: 000403252100001OAI: oai:DiVA.org:kth-210353DiVA: diva2:1119530
Note

QC 20170704

Available from: 2017-07-04 Created: 2017-07-04 Last updated: 2017-07-04Bibliographically approved

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Borgani, RiccardoThorén, Per-AndersForchheimer, DanielDobryden, IlliaHaviland, David B.

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