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A combined averaging and frequency mixing approach for force identification in weakly nonlinear high-Q oscillators: Atomic force microscope
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0003-0675-974X
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0001-8199-5510
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0001-8534-6577
2018 (English)In: Mechanical systems and signal processing, ISSN 0888-3270, E-ISSN 1096-1216, Vol. 101, 38-54 p.Article in journal (Refereed) Published
Abstract [en]

We present a polynomial force reconstruction of the tip-sample interaction force in Atomic Force Microscopy. The method uses analytical expressions for the slow-time amplitude and phase evolution, obtained from time-averaging over the rapidly oscillating part of the cantilever dynamics. The slow-time behavior can be easily obtained in either the numerical simulations or the experiment in which a high-Q resonator is perturbed by a weak nonlinearity and a periodic driving force. A direct fit of the theoretical expressions to the simulated and experimental data gives the best-fit parameters for the force model. The method combines and complements previous works (Platz et al., 2013; Forchheimer et al., 2012 [2]) and it allows for computationally more efficient parameter mapping with AFM. Results for the simulated asymmetric piecewise linear force and VdW-DMT force models are compared with the reconstructed polynomial force and show a good agreement. It is also shown that the analytical amplitude and phase modulation equations fit well with the experimental data. 

Place, publisher, year, edition, pages
Academic Press , 2018. Vol. 101, 38-54 p.
Keyword [en]
Averaging method, Frequency mixing, System identification, Identification (control systems), Mixing, Piecewise linear techniques, Van der Waals forces, Amplitude and phase modulations, Analytical expressions, Force identification, Periodic driving forces, Theoretical expression, Tip-sample interaction, Atomic force microscopy
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:kth:diva-216795DOI: 10.1016/j.ymssp.2017.08.015ISI: 000413612500003Scopus ID: 2-s2.0-85029712317OAI: oai:DiVA.org:kth-216795DiVA: diva2:1156801
Note

Export Date: 24 October 2017; Article; CODEN: MSSPE; Correspondence Address: Sah, S.M.; Nanostructure Physics, KTH Royal Institute of TechnologySweden; email: smsah@kth.se. QC 20171114

Available from: 2017-11-14 Created: 2017-11-14 Last updated: 2017-11-14Bibliographically approved

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Forchheimer, DanielBorgani, RiccardoHaviland, David B.

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