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Program Error Rate-based Wear Leveling for NAND Hash Memory
Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan, Hubei, Peoples R China..
Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan, Hubei, Peoples R China..
Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan, Hubei, Peoples R China..
Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan, Hubei, Peoples R China..
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2018 (English)In: PROCEEDINGS OF THE 2018 DESIGN, AUTOMATION & TEST IN EUROPE CONFERENCE & EXHIBITION (DATE), Institute of Electrical and Electronics Engineers (IEEE), 2018, p. 1241-1246Conference paper, Published paper (Refereed)
Abstract [en]

Wear leveling scheme has became a fundamental issue in the design of Solid State Disk (SSD) based on NAND Flash memory. Existing schemes aim to equalize the number of programming/erase (P/E) cycles and memory raw bit error rates (BER) among all the flash blocks. However, due to fabrication process variation, different blocks of the same flash chip usually have largely different endurance in terns of BER and program error rate (PER). Such conventional design cannot obtain the wear status of flash blocks precisely. This paper proposes PER WE, an efficient PER-based wear leveling scheme that uses PER statistics as the measurement of Hash block wear-out pace, and performs block data swapping to improve the wear leveling efficiency. In our evaluation with four realistic workloads, PER based wear leveling scheme can achieve 17% and 9% variance of program error rate reduction, 8% and 3% program error rate reduction with 5% and 2% system performance degradation when compared to two state-of-the-art wear leveling schemes on average.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2018. p. 1241-1246
Series
Design Automation and Test in Europe Conference and Exhibition, ISSN 1530-1591
National Category
Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-231649DOI: 10.23919/DATE.2018.8342205ISI: 000435148800236Scopus ID: 2-s2.0-85048756244ISBN: 978-3-9819-2630-9 (print)OAI: oai:DiVA.org:kth-231649DiVA, id: diva2:1245172
Conference
Design, Automation and Test in Europe Conference and Exhibition (DATE), MAR 19-23, 2018, Dresden, GERMANY
Note

QC 20180904

Available from: 2018-09-04 Created: 2018-09-04 Last updated: 2018-11-13Bibliographically approved

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Lu, Zhonghai

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