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Modeling and Measuring Viscoelasticity with Dynamic Atomic Force Microscopy
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0002-4331-6940
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0001-8199-5510
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics. KTH, Centres, Nordic Institute for Theoretical Physics NORDITA.ORCID iD: 0000-0003-0675-974X
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2018 (English)In: Physical Review Applied, E-ISSN 2331-7019, Vol. 10, no 2, article id 024017Article in journal (Refereed) Published
Abstract [en]

The interaction between a rapidly oscillating atomic-force-microscope tip and a soft-material surface is described with use of both elastic and viscous forces in a moving-surface model. We present the simplest form of this model, motivating our derivation with the models ability to capture the impact dynamics of the tip and sample with an interaction consisting of two components: interfacial or surface force, and bulk or volumetric force. Analytic solutions to the piecewise linear model identify characteristic time constants, providing a physical explanation for the hysteresis observed in the measured dynamic-force-quadrature curves. Numerical simulation is used to fit the model to experimental data, and excellent agreement is found with a variety of different samples. The model parameters form a dimensionless impact-rheology factor, giving a quantitative physical number to characterize a viscoelastic surface that does not depend on the tip shape or cantilever frequency.

Place, publisher, year, edition, pages
AMER PHYSICAL SOC , 2018. Vol. 10, no 2, article id 024017
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Physical Sciences
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URN: urn:nbn:se:kth:diva-234178DOI: 10.1103/PhysRevApplied.10.024017ISI: 000441722400002Scopus ID: 2-s2.0-85051525393OAI: oai:DiVA.org:kth-234178DiVA, id: diva2:1254408
Note

QC 20181009

Available from: 2018-10-09 Created: 2018-10-09 Last updated: 2020-01-22Bibliographically approved

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Thorén, Per-AndersBorgani, RiccardoForchheimer, DanielDobryden, IlliaClaesson, Per M.Haviland, David B.

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