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Optimal Test Suite Generation for Modified Condition Decision Coverage Using SAT Solving
Japan.
Japan.
Japan.
KTH, School of Electrical Engineering and Computer Science (EECS), Theoretical Computer Science, TCS.ORCID iD: 0000-0002-3656-1614
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2018 (English)In: 37th International Conference on Computer Safety, Reliability and Security, SAFECOMP 2018, Springer, 2018, p. 123-138Conference paper, Published paper (Refereed)
Abstract [en]

Boolean expressions occur frequently in descriptions of computer systems, but they tend to be complex and error-prone in complex systems. The modified condition decision coverage (MCDC) criterion in system testing is an important testing technique for Boolean expression, as its usage mandated by safety standards such as DO-178 [1] (avionics) and ISO26262 [2] (automotive). In this paper, we develop an algorithm to generate optimal MCDC test suites for Boolean expressions. Our algorithm is based on SAT solving and generates minimal MCDC test suites. Experiments on a real-world avionics system confirm that the technique can construct minimal MCDC test suites within reasonable times, and improves significantly upon prior techniques.

Place, publisher, year, edition, pages
Springer, 2018. p. 123-138
Keywords [en]
Avionics, Fighter aircraft, Network security, Avionics systems, Boolean expressions, Error prones, Modified condition decision coverage, Safety standard, SAT-solving, System testing, Testing technique, Safety testing
National Category
Computer Sciences
Identifiers
URN: urn:nbn:se:kth:diva-236369DOI: 10.1007/978-3-319-99130-6_9ISI: 000458564600009Scopus ID: 2-s2.0-85053750350ISBN: 9783319991290 (print)OAI: oai:DiVA.org:kth-236369DiVA, id: diva2:1260893
Conference
18 September 2018 through 21 September 2018
Note

QC 20181105

Available from: 2018-11-05 Created: 2018-11-05 Last updated: 2019-03-05Bibliographically approved

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Artho, Cyrille

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CiteExportLink to record
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Citation style
  • apa
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  • nn-NB
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Output format
  • html
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  • asciidoc
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