Histogram Tests for Wideband Applications
2008 (English)In: IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, Vol. 57, no 1, 70-75 p.Article in journal (Refereed) Published
Characterization and testing of analog-to-digital converters (ADCs) are important for many reasons. A histogram test is a common method to characterize the linearity features of an ADC. Two commonly used stimulus signals are sine waves and Gaussian noise. This paper presents a metrological comparison between Gaussian and sine-wave histogram tests for wide-band applications, that is, we evaluate the performance of the characterization of the ADC and the usability of postcorrection. A postcorrection procedure involves the characterization of the ADC nonlinearity and then the use of this information by processing the ADC output samples to remove the distortion. The results show that the Gaussian histogram test gives reasonable accuracy in measuring nonlinearities. However, it does not result in a suitable model for postcorrection in wideband applications. A single-tone sine-wave histogram will be a better basis for postcorrection. The best result can be obtained if the lookup table is trained with several single-tone sine waves in the frequency band.
Place, publisher, year, edition, pages
2008. Vol. 57, no 1, 70-75 p.
analog-to-digital converters (ADCs); histogram; measurements; test
Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-7591DOI: 10.1109/TIM.2007.908274ISI: 000251947400010ScopusID: 2-s2.0-43949129589OAI: oai:DiVA.org:kth-7591DiVA: diva2:12666
QC 201006292007-11-082007-11-082011-11-08Bibliographically approved