Measuring Volterra Kernels of Analog To Digital Converters Using a Stepped Three-Tone Scan
2008 (English)In: IEEE Transactions on Instrumentation and Measurement, ISSN 0018-9456, Vol. 57, no 4, 666-671 p.Article in journal (Refereed) Published
The Volterra theory can be used to mathematically model nonlinear dynamic components such as analog-to-digital converters (ADCs). This paper describes how frequency-domain Volterra kernels of an ADC are determined from measurements. The elements of the Volterra theory are given, and practical issues are considered, such as methods for signal conditioning and finding the appropriate test signals scenario and suitable sampling frequency. The results show that, for the used pipeline ADC, the frequency dependence is significantly stronger for second-order difference products than for sum products and the linear frequency dependence was not as pronounced as that of the second-order Volterra kernel. It is suggested that the Volterra kernels have the symmetry properties of a specific box model, namely, the parallel Hammerstein system.
Place, publisher, year, edition, pages
2008. Vol. 57, no 4, 666-671 p.
analog-to-digital converter (ADC), measurements, test, Volterra kernels
Electrical Engineering, Electronic Engineering, Information Engineering
IdentifiersURN: urn:nbn:se:kth:diva-7592DOI: 10.1109/TIM.2007.911579ISI: 000254029600001ScopusID: 2-s2.0-41549085064OAI: oai:DiVA.org:kth-7592DiVA: diva2:12667
QC 201009222007-11-082007-11-082011-11-10Bibliographically approved