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Characterizing 3D Charge Trap NAND Flash: Observations, Analyses and Applications
Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan, Hubei, Peoples R China..
Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan, Hubei, Peoples R China..
Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan, Hubei, Peoples R China..
KTH, School of Information and Communication Technology (ICT).ORCID iD: 0000-0003-0061-3475
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2018 (English)In: Proceedings - 2018 IEEE 36th International Conference on Computer Design, ICCD 2018, Institute of Electrical and Electronics Engineers (IEEE), 2018, p. 381-388, article id 8615714Conference paper, Published paper (Refereed)
Abstract [en]

In the 3D era, the Charge Trap (CT) NAND flash is employed by mainstream products, thus having a deep understanding of its characteristics is becoming increasingly crucial for designing flash-based systems. In this paper, to enable such understanding, we implement comprehensive experiments on advanced 3D CT NAND flash chips by developing an ARM and FPGA-based evaluation platform. Based on the experimental results, we first make distinct observations on the characteristics of 3D CT NAND flash, including its performance and reliability features. Then we give analyses of the observations from physical and circuit aspects. Finally, based on the unique characteristics of 3D CT NAND flash, suggestions to optimize the flash management algorithms in real applications are presented.

Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE), 2018. p. 381-388, article id 8615714
Series
Proceedings IEEE International Conference on Computer Design, ISSN 1063-6404
Keywords [en]
3D CT NAND flash, performance, reliability
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-245098DOI: 10.1109/ICCD.2018.00064ISI: 000458293200053Scopus ID: 2-s2.0-85061198581ISBN: 978-1-5386-8477-1 (print)OAI: oai:DiVA.org:kth-245098DiVA, id: diva2:1294651
Conference
36th International Conference on Computer Design, ICCD 2018; Holiday Inn Orlando - Disney Springs Area Orlando; United States; 7 October 2018 through 10 October 2018
Note

QC 20190308

Available from: 2019-03-08 Created: 2019-03-08 Last updated: 2019-03-08Bibliographically approved

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Lu, Zhonghai

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