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Fast Multifrequency Measurement of Nonlinear Conductance
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0001-8199-5510
Lulea Univ Technol, Dept Engn Sci & Math, SE-97187 Lulea, Sweden..
Lulea Univ Technol, Dept Engn Sci & Math, SE-97187 Lulea, Sweden..
KTH, School of Engineering Sciences (SCI), Applied Physics, Nanostructure Physics.ORCID iD: 0000-0001-8534-6577
2019 (English)In: Physical Review Applied, E-ISSN 2331-7019, Vol. 11, no 4, article id 044062Article in journal (Refereed) Published
Abstract [en]

We describe a phase-coherent multifrequency lock-in measurement technique that uses the inverse Fourier transform to reconstruct the nonlinear current-voltage characteristic of a nanoscale junction. The method provides separation of the galvanic and displacement currents in the junction and easy cancellation of the parasitic displacement current from the measurement leads. These two features allow us to overcome traditional limitations imposed by the low conductance of the junction and the high capacitance of the leads, thus providing an increase in measurement speed of several orders of magnitude. We demonstrate the method in the context of conductive atomic force microscopy, acquiring current-voltage characteristics at every pixel while scanning at standard imaging speed.

Place, publisher, year, edition, pages
AMER PHYSICAL SOC , 2019. Vol. 11, no 4, article id 044062
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:kth:diva-251278DOI: 10.1103/PhysRevApplied.11.044062ISI: 000465185700002Scopus ID: 2-s2.0-85064857475OAI: oai:DiVA.org:kth-251278DiVA, id: diva2:1315578
Note

QC 20190514

Available from: 2019-05-14 Created: 2019-05-14 Last updated: 2019-05-14Bibliographically approved

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Borgani, RiccardoHaviland, David B.

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