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Mapping Accuracy of the Surface Topography in Optical Measurements
KTH. (Manufacturing and Metrology Systems)
Koszalin University of Technology.
Koszalin University of Technology.
Koszalin University of Technology.
2014 (English)In: / [ed] Jerzy Sladek, Wladyslaw Jakubiec, 2014Conference paper, Published paper (Refereed)
Abstract [en]

Accuracy of measurement data registration considerably influences on values of surface topography parameters. Obtaining high precision and therefore correct mapping of the evaluated surface is of great importnace not only in case of determining surface roughness parameters but also its features, essentail because of service reason. The hereby work evaluates accuracy of mapping surface texture of surface roughness standars (standard with a single groove with nominal height 4.646 um, and surface roughness standard DIN 4763 with nominal value of parameter Ra=0.25 um). The measurements weere carried out using advanced optical measuremne t technniques, making use of white light interferometry and confocal laser scanning microscopy. Analysis of the obtained measurement data allowe fro determing the precision of mapping the stereometric feature of the evaluated surfaces and the possibilities of the applied devices.

Place, publisher, year, edition, pages
2014.
Keywords [en]
surface topography, accuracy, optical measurement
National Category
Other Engineering and Technologies not elsewhere specified
Research subject
Production Engineering
Identifiers
URN: urn:nbn:se:kth:diva-260505ISBN: 978-83-63713-88-1 (print)OAI: oai:DiVA.org:kth-260505DiVA, id: diva2:1355765
Conference
11th International Scientific Conference “Coordinate Measuring Technique” CMT2014
Available from: 2019-09-30 Created: 2019-09-30 Last updated: 2019-09-30

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CiteExportLink to record
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Citation style
  • apa
  • harvard1
  • ieee
  • modern-language-association-8th-edition
  • vancouver
  • Other style
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Language
  • de-DE
  • en-GB
  • en-US
  • fi-FI
  • nn-NO
  • nn-NB
  • sv-SE
  • Other locale
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Output format
  • html
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  • asciidoc
  • rtf