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High-power InGaAs/GaAs 1.3 μm VCSELs based on novel electrical confinement scheme
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.
KTH, School of Information and Communication Technology (ICT), Microelectronics and Applied Physics, MAP.ORCID iD: 0000-0002-9040-4740
2008 (English)In: Electronics Letters, ISSN 0013-5194, E-ISSN 1350-911X, Vol. 44, no 6, 414-416 p.Article in journal (Refereed) Published
Abstract [en]

Reported are 1.3 mu m InGaAs/GaAs vertical-cavity surface-emitting lasers (VCSELs) with a novel electrical confinement scheme based on lithographic definition and selective area epitaxial regrowth in the cavity region. More than 6 mW of output power with a record high differential efficiency of more than 70% is emitted from 10 mu m large devices.

Place, publisher, year, edition, pages
2008. Vol. 44, no 6, 414-416 p.
Keyword [en]
Epitaxial growth; Lithography; Semiconducting indium gallium arsenide; Cavity region; Differential efficiency; Electrical confinement scheme
National Category
Condensed Matter Physics
Identifiers
URN: urn:nbn:se:kth:diva-8626DOI: 10.1049/el:20080056ISI: 000254797500016Scopus ID: 2-s2.0-40749119753OAI: oai:DiVA.org:kth-8626DiVA: diva2:13998
Note
QC 20100825Available from: 2008-06-03 Created: 2008-06-03 Last updated: 2017-12-14Bibliographically approved
In thesis
1. Design and fabrication of long wavelength vertical cavity lasers on GaAs substrates
Open this publication in new window or tab >>Design and fabrication of long wavelength vertical cavity lasers on GaAs substrates
2008 (English)Doctoral thesis, comprehensive summary (Other scientific)
Abstract [en]

Vertical cavity surface emitting lasers (VCSELs) are today a commodity on the short wavelength laser market due to the ease with which they are manufactured. Much effort has in the last decade been directed towards making long wavelength VCSELs as successful in the marketplace. This has not been achieved due to the much more difficult fabrication technologies needed for realising high performance long wavelength VCSELs. At one point, GaInNAs quantum wells gain regions grown on GaAs substrates seemed to be the solution as it enabled all-epitaxial VCSELs that could make use of high contrast AlGaAs-based distributed Bragg reflectors (DBRs) as mirrors and lateral selective oxidation for optical and electrical confinement, thereby mimicking the successful design of short wavelength VCSELs. Although very good device results were achieved, reproducible and reliable epitaxial growth of GaInNAs quantum wells proved difficult and the technology has not made its way into high-volume production. Other approaches to the manufacturing and material problems have been to combine mature InP-based gain regions with high contrast AlGaAs-based DBRs by wafer fusion or with high contrast dielectric DBRs. Commonly, a patterned tunnel junction provides the electrical confinement in these VCSELs. Excellent performance has been achieved in this way but the fabrication process is difficult.

In this work, we have employed high strain InGaAs quantum wells along with large detuning between the gain peak and the emission wavelength to realize GaAs-based long wavelength VCSELs. All-epitaxial VCSELs with AlGaAs-based DBRs and lateral oxidation confinement were fabricated and evaluated. The efficiency of these VCSELs was limited due to the optical absorption in the doped DBRs. To improve the efficiency and manufacturability, two novel optical and electrical confinement schemes based on epitaxial regrowth of current blocking layers were developed. The first scheme is based on a single regrowth step and requires very precise processing. This scheme was therefore not developed beyond the first generation but single mode power of 0.3 mW at low temperature, -10ºC, was achieved. The second scheme is based on two epitaxial regrowth steps and does not require as precise processing. Several generations of this design were manufactured and resulted in record high power of 8 mW at low temperature, 5ºC, and more than 3 mW at high temperature, 85ºC. Single mode power was more modest with 1.5 mW at low temperature and 0.8 mW at high temperature, comparable to the performance of the single mode lateral oxidation confined VCSELs. The reason for the modest single mode power was found to be a non-optimal cavity shape after the second regrowth that leads to poor lateral overlap between the gain in the quantum wells and the intensity of the optical field.

Place, publisher, year, edition, pages
Stockholm: KTH, 2008. 79 p.
Series
Trita-ICT/MAP AVH, ISSN 1653-7610 ; 2008:10
Keyword
VCSEL, Selective Area Epitaxy, Epitaxial regrowth, Laser
National Category
Condensed Matter Physics
Identifiers
urn:nbn:se:kth:diva-4795 (URN)978-91-7178-990-7 (ISBN)
Public defence
2008-06-12, N2, Electrum 3, Isafjordsgatan 28 A/D, Kista, 10:00
Opponent
Supervisors
Note
QC 20100825Available from: 2008-06-03 Created: 2008-06-03 Last updated: 2010-08-25Bibliographically approved

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Hammar, Mattias

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