A 9 keV electron-impact liquid-gallium-jet x-ray source
2008 (English)In: Review of Scientific Instruments, ISSN 0034-6748, E-ISSN 1089-7623, Vol. 79, no 1, 016102- p.Article in journal (Refereed) Published
We demonstrate a high-brightness compact 9 keV electron-impact microfocus x-ray source based on a liquid-gallium-jet anode. A similar to 30 W, 50 kV electron gun is focused onto the similar to 20 m/s, 30 mu m diameter liquid-gallium-jet anode to produce an similar to 10 mu m full width at half maximum x-ray spot. The peak spectral brightness is >2 x 10(10) photons/(s mm(2) mrad(2) x 0.1% BW). Calculation and experiments show potential for increasing this brightness by approximately three orders of magnitude, making the source suitable for laboratory-scale x-ray crystallography and hard x-ray microscopy.
Place, publisher, year, edition, pages
2008. Vol. 79, no 1, 016102- p.
Electron guns, Gallium, Luminance, Microscopic examination, Photons, X ray crystallography, Electron impact, Hard x-ray microscopy, Peak spectral brightness, X-ray spot
Other Engineering and Technologies
IdentifiersURN: urn:nbn:se:kth:diva-8666DOI: 10.1063/1.2833838ISI: 000252821800060ScopusID: 2-s2.0-38849143134OAI: oai:DiVA.org:kth-8666DiVA: diva2:14047
QC 201009152008-06-042008-06-042010-09-15Bibliographically approved