Optical band-edge absorption of oxide compound SnO2
2006 (English)In: Applied Surface Science, ISSN 0169-4332, E-ISSN 1873-5584, Vol. 252, no 15, 5361-5364 p.Article in journal (Refereed) Published
Tin oxide (SnO2) is an important oxide for efficient dielectrics, catalysis, sensor devices, electrodes and transparent conducting coating oxide technologies. SnO2 thin film is widely used in glass applications due to its low infra-red heat emissivity. In this work, the SnO2 electronic band-edge structure and optical properties are studied employing a first-principle and fully relativistic full-potential linearized augmented plane wave (FPLAPW) method within the local density approximation (LDA). The optical band-edge absorption alpha(omega) of intrinsic SnO2 is investigated experimentally by transmission spectroscopy measurements and their roughness in the light of the atomic force microscopy (AFM) measurements. The sample films were prepared by spray pyrolysis deposition method onto glass substrate considering different thickness layers. We found for SnO2 qualitatively good agreement of the calculated optical band-gap energy as well as the optical absorption with the experimental results.
Place, publisher, year, edition, pages
2006. Vol. 252, no 15, 5361-5364 p.
tin oxide, transparent conducting thin film, SnO2, transparent electrodes
Other Engineering and Technologies not elsewhere specified
IdentifiersURN: urn:nbn:se:kth:diva-8766DOI: 10.1016/j.apsusc.2005.12.040ISI: 000238623300029ScopusID: 2-s2.0-33744520852OAI: oai:DiVA.org:kth-8766DiVA: diva2:14179
QC 20101109. Conference: 8th International Conference on Atomically Controlled Surfaces, Interfaces, and Nanostructures/13th International Congress on Thin Films. Stockholm, SWEDEN. JUN 20-23, 2005 2008-06-172008-06-172011-10-04Bibliographically approved