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Sub-wavelength THz imaging through optical rectification
KTH, School of Engineering Sciences (SCI), Applied Physics, Laser Physics. KTH, School of Engineering Sciences (SCI), Physics.ORCID iD: 0000-0001-7688-1367
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2019 (English)In: International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz, IEEE Computer Society , 2019Conference paper, Published paper (Refereed)
Abstract [en]

Sub-wavelength THz imaging has previously been demonstrated by the optical rectification method, i.e. generating THz waves in the sample [1]. We have rendered the initial experimental setup more practical by using a simple fs laser oscillator and an efficient photo-conducting detector. We thus recorded images, at different THz frequencies with a 41-μm lateral resolution, of a sample made of ZnTe grains, and generated THz peak magnitudes with a 33 μm and 12 μm lateral resolution of a periodically poled KTP crystal.

Place, publisher, year, edition, pages
IEEE Computer Society , 2019.
Keywords [en]
II-VI semiconductors, Tellurium compounds, Zinc compounds, Lateral resolution, Optical rectifications, Periodically poled KTP, Photo-conducting detectors, Sub-wavelength, THz frequencies, THz imaging, THz waves, Terahertz waves
National Category
Physical Sciences
Identifiers
URN: urn:nbn:se:kth:diva-268396DOI: 10.1109/IRMMW-THz.2019.8873798Scopus ID: 2-s2.0-85074688014ISBN: 9781538682852 (print)OAI: oai:DiVA.org:kth-268396DiVA, id: diva2:1426808
Conference
44th International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz 2019, 1 September 2019 through 6 September 2019
Note

QC 20200427

Available from: 2020-04-27 Created: 2020-04-27 Last updated: 2020-04-27Bibliographically approved

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Laurell, Fredrik

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