Orthorhombic lithium cuprate LiCu2O2 was exposed to high temperature and pressure of 950 degrees C and 4.5 GPa. X-ray diffraction studies indicate that the treated samples of LiCu2O2 had tetragonal symmetry, in contrast to the orthorhombic one of the phase synthesized at atmospheric pressure. Temperature dependences of dielectric permittivity epsilon and tangent of dielectric loss tan delta, as well as DC (direct current), resistivity, rho were investigated in the temperature range 77-296 K. No anomalous changes of the studied parameters inherent in the phase transitions were detected in this temperature range. The rho(T) dependences were common to semiconductors. These dependences were linearized in the Mott coordinates log rho-1/T (0.25). It indicated the variable length hopping mechanism of conduction between the next nearest neighbors in the studied samples.