Admittance-Dissipativity Analysis and Shaping of Dual-Sequence Current Control for VSCsShow others and affiliations
2022 (English)In: IEEE Journal of Emerging and Selected Topics in Power Electronics, ISSN 2168-6777, E-ISSN 2168-6785, Vol. 10, no 1, p. 324-335Article in journal (Refereed) Published
Abstract [en]
This paper analyzes the admittance-dissipativity of dual-sequence current control for grid-connected voltage-source converters (VSCs). The output admittance model of dual-sequence current control is first developed in the stationary reference frame by using complex vectors. Impacts of digital filters used within current control and voltage-feedforward (VFF) control loops, and of the delay compensation at the fundamental frequency, are then evaluated. It is found that the cascaded use of sequence-decomposition filter (SDF) and the low-pass filter (LPF) in the VFF control loop adds a non-dissipative region in the output admittance, and the fundamental-frequency delay-compensation further worsens the dissipativity. An analytical design method for the LPF is then developed to mitigate the non-dissipative region, which lowers the instability risks and improves the stability robustness of dual-sequence current control under different grid conditions. Lastly, simulations and experimental results corroborate theoretical analyses.
Place, publisher, year, edition, pages
Institute of Electrical and Electronics Engineers (IEEE) , 2022. Vol. 10, no 1, p. 324-335
Keywords [en]
Admittance, Converters, Current control, delay compensation, Delays, Digital filter, dissipativity, Power conversion, sequence control, Stability analysis, Transfer functions, voltage feedforward, Control systems, Digital filters, Electric current control, Natural frequencies, System stability, Analytical design method, Decomposition filter, Dissipativity analysis, Fundamental frequencies, Stability robustness, Stationary reference frames, Voltage feed-forward, Voltage-source converter, Low pass filters
National Category
Other Electrical Engineering, Electronic Engineering, Information Engineering
Identifiers
URN: urn:nbn:se:kth:diva-307428DOI: 10.1109/JESTPE.2021.3067553ISI: 000750333100032Scopus ID: 2-s2.0-85103293669OAI: oai:DiVA.org:kth-307428DiVA, id: diva2:1631888
Note
QC 20220314
2022-01-252022-01-252022-06-25Bibliographically approved